International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 

Vote for P-Members

P-Members

Voting
P-Members

In favour
In favour %
Criteria
Result
8 8 100 >=66.7% APPROVED

All Votes

Total

Votes Cast
Total

Against
Against %
Criteria
Result
12 0 0 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 91/1579/CDV

 

Project : IEC 61189-5-504 ED1

IEC 61189-5-504 ED1: Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 5-504: General test methods for materials and assemblies - Process ionic contamination testing (PICT)

 

Reference Circulation date Closing date Downloads
91/1579/CDV 2019-06-28 2019-09-20
Compilation of Comments
CC file    
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Austria O 2019-07-30 Y -
Belgium O 2019-09-20 A -
Brazil O 2019-09-19 A -
Bulgaria O -
China P 2019-09-09 Y -
Czech Republic O 2019-09-05 Y Y
Denmark O -
Finland P 2019-09-18 A -
France O 2019-09-20 A -
Germany P 2019-09-18 Y Y
Greece - 2019-09-19 A -
Hungary O -
India P 2019-09-16 A -
Israel O -
Italy P 2019-09-17 Y -
Japan P 2019-09-19 Y -
Korea, Republic of P 2019-09-20 Y -
Netherlands P 2019-09-17 A -
Norway O -
Poland O 2019-09-18 Y -
Portugal O 2019-09-20 A -
Qatar - 2019-09-17 Y -
Romania O 2019-09-13 A -
Russian Federation P 2019-09-19 Y -
Serbia O -
Slovenia O -
Spain O -
Sweden O 2019-09-17 A -
Switzerland O -
Turkey O -
Ukraine O -
United Kingdom P 2019-08-30 Y Y
United States of America P 2019-09-18 Y -

NOTES:



  1. Vote: Does the National Committee agree to the circulation of the draft as a FDIS:
    Y = In favour; N = Against; A = Abstention.

  2. Abstentions are not taken into account when totalizing the votes.

  3. P-members not voting: (0).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.