TC 47

Semiconductor devices

 

P-Members vote

P-Members

Voting
P-Members

In favour
In favour %
Criteria
Result
10 10 100 >=66.7% APPROVED

All Votes

Total

Votes Cast
Total

Against
Against %
Criteria
Result
12 0 0 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 47/2661(F)/CDV

 

Project : IEC 60749-28 ED2

IEC 60749-28 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

 

Reference Circulation date Closing date Downloads
47/2661(F)/CDV 2020-11-27 2021-02-12
Compilation of Comments
CC file    
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Austria P 2021-02-10 A -
Belarus O 2021-02-08 Y -
Belgium P 2021-02-12 A -
Brazil O 2021-02-11 A -
Bulgaria O -
China P 2021-02-01 Y Y
Czech Republic O -
Denmark O -
Finland O 2020-11-23 A -
France P 2021-01-25 A -
Germany P 2021-02-12 Y -
Greece - 2021-02-12 A -
Hungary O -
India O -
Iran O -
Ireland O -
Israel P 2021-02-11 A -
Italy P 2021-02-04 Y -
Japan P 2021-02-09 Y -
Korea, Republic of P 2021-02-10 Y -
Netherlands P 2021-02-10 Y Y
Norway O -
Pakistan P 2021-02-12 Y -
Philippines, Rep. of the O -
Poland O 2021-02-09 A -
Portugal - 2021-02-12 A -
Romania O -
Russian Federation P 2021-02-05 Y -
Serbia O -
Singapore P 2021-02-08 A -
Spain O -
Sweden O -
Switzerland O 2021-01-20 A -
Thailand O -
Turkey O -
Ukraine O -
United Arab Emirates - 2021-02-09 Y -
United Kingdom P 2021-01-22 Y -
United States of America P 2021-02-12 Y -

NOTES:



  1. Does the National Committee approve the CDV?
    Y = In favour; N = Against; A = Abstention.

  2. Abstentions are not taken into account when totalizing the votes.

  3. P-members not voting: (0).


*Comments not included in the compiled table, available as a separate file, because they were not submitted using the template Form-Comments.