International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices


Comments summarized

Comments received
No comments
No response
P-members 4 10 1
O-members 0 4 17
Non-members 0 2 0
Total 4 16 18

P-members with no response: Netherlands

*Comments not included in the compiled table, available as a separate file, because they were not submitted using the template Form-Comments.

 Illustration: Voting

Report of Comments

Document 47/2622/CD


Project : IEC 63275-1 ED1

IEC 63275-1 ED1: Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability


Reference Circulation date Closing date Downloads
47/2622/CD 2020-03-27 2020-06-19
Compilation of Comments
CC file    
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All comments

Austria P 2020-06-18 N
Belarus O 2020-06-15 N
Belgium P 2020-06-19 N
Brazil O 2020-06-19 N
Bulgaria O
China P 2020-06-08 Y
Czech Republic O
Denmark O
Finland O 2020-06-11 N
France P 2020-04-21 N
Germany P 2020-06-17 Y
Greece - 2020-06-18 N
Hungary O
India O
Iran O 2020-06-16 N
Ireland O
Israel P 2020-06-18 N
Italy P 2020-06-16 N
Japan P 2020-06-15 N
Korea, Republic of P 2020-06-19 Y
Netherlands P
Norway O
Pakistan P 2020-06-19 N
Philippines, Rep. of the O
Poland O
Portugal - 2020-06-19 N
Romania O
Russian Federation P 2020-06-19 N
Serbia O
Singapore P 2020-04-03 N
Spain O
Sweden O
Switzerland O
Thailand O
Turkey O
Ukraine O
United Kingdom P 2020-06-16 N
United States of America P 2020-06-19 Y