International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices


Comments summarized

Comments received
No comments
No response
P-members 2 11 1
O-members 0 4 17
Non-members 0 4 0
Total 2 19 18

P-members with no response: Netherlands

*Comments rejected because they were not submitted in the IEC Comment form.

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Report of Comments

Document 47/2599/CD


Project : IEC 63229 ED1

IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate


Reference Circulation date Closing date Downloads
47/2599/CD 2019-10-11 2020-01-03
Compilation of Comments
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All comments

Austria P 2019-12-19 N
Belarus O 2020-01-03 N
Belgium P 2019-12-20 N
Brazil O 2020-01-03 N
Bulgaria O
China P 2019-12-23 N
Czech Republic O
Côte D'Ivoire - 2019-12-20 N
Denmark O
Finland O 2019-10-13 N
France P 2020-01-03 N
Germany P 2019-12-13 Y
Greece - 2019-12-24 N
Hungary O
India O
Iran O
Ireland O
Italy P 2019-12-13 N
Japan P 2020-01-02 Y
Korea, Republic of P 2020-01-03 N
Netherlands P
Norway O
Pakistan P 2020-01-03 N
Philippines, Rep. of the O
Poland O
Portugal - 2020-01-03 N
Romania O 2019-12-23 N
Russian Federation P 2019-12-27 N
Serbia O
Singapore P 2019-10-17 N
Spain O
Sweden O
Switzerland O
Thailand O
Turkey O
Ukraine O
United Arab Emirates - 2019-12-28 N
United Kingdom P 2019-12-16 N
United States of America P 2019-12-20 N