International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

P-Members vote

P-Members

Voting
P-Members

In favour
In favour %
Criteria
Result
10 10 100 >=66.7% APPROVED

All Votes

Total

Votes Cast
Total

Against
Against %
Criteria
Result
11 0 0 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 47/2588/CDV

 

Project : IEC 63068-3:2020 ED1

IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

 

Reference Circulation date Closing date Downloads
47/2588/CDV 2019-09-27 2019-12-20
Compilation of Comments
CC file    
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Austria P 2019-11-28 Y -
Belarus O 2019-12-20 Y -
Belgium P 2019-12-17 A -
Brazil O 2019-12-20 A -
Bulgaria O -
China P 2019-12-09 Y -
Czech Republic O -
Côte D'Ivoire - 2019-12-19 A -
Denmark O -
Finland O 2019-09-30 A -
France P 2019-12-20 A -
Germany P 2019-12-13 Y Y
Greece - 2019-12-20 A -
Hungary O -
India O -
Iran O -
Ireland O -
Italy P 2019-12-13 Y -
Japan P 2019-12-11 Y -
Korea, Republic of P 2019-12-13 Y Y
Netherlands P 2019-12-16 A -
Norway O -
Pakistan P 2019-12-10 Y -
Philippines, Rep. of the O -
Poland O -
Portugal - 2019-12-20 A -
Qatar - 2019-12-16 A -
Romania O 2019-12-20 A -
Russian Federation P 2019-12-19 Y -
Serbia O -
Singapore P 2019-10-03 Y -
Spain O -
Sweden O -
Switzerland O -
Thailand O -
Turkey O -
Ukraine O -
United Kingdom P 2019-11-26 Y -
United States of America P 2019-12-20 A -

NOTES:



  1. Does the National Committee approve the CDV?
    Y = In favour; N = Against; A = Abstention.

  2. Abstentions are not taken into account when totalizing the votes.

  3. P-members not voting: (0).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.