International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

P-Members vote

P-Members

Voting
P-Members

In favour
In favour %
Criteria
Result
9 8 88.9 >=66.7% APPROVED

All Votes

Total

Votes Cast
Total

Against
Against %
Criteria
Result
11 1 9.1 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 47/2584/CDV

 

Project : IEC 60749-41 ED1

IEC 60749-41 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

 

Reference Circulation date Closing date Downloads
47/2584/CDV 2019-08-23 2019-11-15
Compilation of Comments
CC file    
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Austria P 2019-11-14 Y -
Belarus O 2019-11-15 Y -
Belgium P 2019-11-12 A -
Brazil O 2019-11-14 A -
Bulgaria O -
China P 2019-11-04 Y -
Czech Republic O -
Denmark O -
Finland O 2019-08-26 A -
France P 2019-11-15 A -
Germany P 2019-11-13 N Y
Greece - 2019-11-15 A -
Hungary O -
India O 2019-11-15 A -
Iran O -
Ireland O -
Italy P 2019-11-14 A -
Japan P 2019-11-13 Y -
Korea, Republic of P -
Netherlands P 2019-10-03 A -
Norway O -
Pakistan P 2019-11-15 Y -
Philippines, Rep. of the O -
Poland O 2019-11-14 A -
Portugal - 2019-11-15 A -
Qatar - 2019-11-10 Y -
Romania O 2019-11-15 A -
Russian Federation P 2019-11-15 Y -
Serbia O -
Singapore P 2019-08-30 Y -
Spain O -
Sweden O 2019-11-15 A -
Switzerland O -
Thailand O -
Turkey O -
Ukraine O -
United Kingdom P 2019-10-22 Y -
United States of America P 2019-11-14 Y Y

NOTES:



  1. Does the National Committee approve the CDV?
    Y = In favour; N = Against; A = Abstention.

  2. Abstentions are not taken into account when totalizing the votes.

  3. P-members not voting: Korea, Republic of (1).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.