International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 82

Solar photovoltaic energy systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 82WG 2 Y. UchidaMERGED 2019

History

Stage
Document
Downloads
Decision Date
Target Date
DECPUB
2019-07-11 
RPUB
2019-07-24 
BPUB
2019-07-302019-10
MERGED
2019-09-202019-10
  

Abstract

IEC 62979:2017 provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.

Project

IEC 62979/FRAGF ED1

Photovoltaic modules - Bypass diode - Thermal runaway test