International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 2Mr Jim LynchCCDV2020-102027

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2225/NP PDF file 232 kB
2015-02-06 
ANW
47/2257/RVN Word file 158 kB
PDF file 202 kB
2015-10-092015-06
1CD
47/2325/CD PDF file 405 kB
2016-10-282016-05
PCC
2016-12-232016-12
ACDV
47/2441/CC PDF file 126 kB
Word file 85 kB
2017-11-242019-01
TCDV
2019-07-012019-08
CCDV
47/2584/CDV
PDF file 311 kB
PDF file 341 kB
2019-08-232019-08
PRVC
 2019-11

Project

IEC 60749-41 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

 

Remark:

Target date of TCDV changed from 2019-01 to 2022-01 (47/2525/RM).

 

Associated Documents:

SMB/6250/DL

PDF file 559 kB