International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 2Mr Jim LynchPRVC2020-072025

History

Stage
Document
Downloads
Decision Date
Target Date
ACDV
47/2560/RR PDF file 91 kB
2019-04-01 
TCDV
2019-04-022019-05
CCDV
47/2562/CDV
PDF file 246 kB
PDF file 310 kB
2019-05-242019-05
PRVC
2019-08-162019-08
 2019-11

Project

IEC 60749-30 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing