International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56WG 4 DELPUB1997-04 

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
1985-05-01 
ANW
1985-05-02 
1CD
1989-05-01 
CCDV
56(SEC.)/379/CDV  
1994-02-11 
AFDIS
56/431/RVC  
1995-01-13 
DECFDIS
1996-06-161996-03
RFDIS
1996-06-171996-07
CFDIS
56/532/FDIS  
1996-12-061996-10
APUB
56/574/RVD  
1997-03-141997-03
BPUB
1997-04-071997-04
PPUB
1997-05-161997-05
DELPUB
2008-08-13 
  

Project

IEC 61649:1997 ED1

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

 

 

Associated Documents:

56/838/MCR

PDF file 87 kB
56/837/DC

PDF file 82 kB
56/828/DC

PDF file 61 kB
56/511/RM

 
56/1243/MCR

PDF file 65 kB