TC 48

Electrical connectors and mechanical structures for electrical and electronic equipment

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 48MT 1 Vincent PascucciPPUB2017-012021

History

Stage
Document
Downloads
Decision Date
Target Date
1CD
48/546/CD PDF file 417 kB
2014-01-24 
AMW
48/545/RR PDF file 420 kB
2014-01-24 
ACDV
48/550/CC Word file 138 kB
PDF file 86 kB
2014-07-252014-05
CDTS
48/563/DTS PDF file 411 kB
2015-09-112014-12
APUB
48/568/RVC PDF file 142 kB
2015-12-182016-05
DECPUB
2016-11-032016-03
RPUB
2016-11-18 
BPUB
2016-12-08 
PPUB
2017-01-252017-01
  

Abstract

IEC TS 61586:2017 deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing programme. The basic intrinsic degradation mechanisms of connectors, which are those mechanisms which exist as a result of the materials and geometries chosen for the connector design, are reviewed to provide a context for the development of the desired test programme. While extrinsic degradation mechanisms may also significantly affect the performance of connectors, they vary widely by application and thus are not addressed in this document. This second edition cancels and replaces the first edition published in 1997. This edition constitutes a technical revision. The main technical changes with regard to the previous edition are as follows: A specific “basic” testing protocol is defined which utilizes a single test group subjecting connectors to multiple stresses, Additional information is provided concerning test acceleration factors, A discussion of the limitations of providing MTTF/MTBF estimates for connectors has been added and the bibliography has been expanded.

Project

IEC TS 61586:2017 ED2

Estimation of the reliability of electrical connectors