International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47EWG 8Mr Alexander JausCFDIS2020-102023

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47E/484/NP PDF file 1125 kB
2014-08-08 
ANW
47E/496/RVN Word file 133 kB
PDF file 48 kB
2015-01-302014-12
1CD
47E/511/CD PDF file 540 kB
2015-07-312015-06
A2CD
47E/534/CC Word file 364 kB
PDF file 380 kB
2016-01-222015-11
2CD
47E/536/CD PDF file 752 kB
2016-01-292016-01
CDM
47E/549/CC Word file 459 kB
PDF file 373 kB
2016-07-222016-05
A2CD
47E/549A/CC PDF file 446 kB
Word file 1413 kB
2017-01-132017-02
3CD
47E/578A/CD PDF file 898 kB

2017-08-042017-07
PCC
2017-09-292017-09
ACD
47E/618/CC PDF file 344 kB
Word file 411 kB
2018-06-292018-07
4CD
47E/620/CD
PDF file 757 kB
2018-07-13 
PCC
2018-09-072018-09
ACDV
47E/646/CC PDF file 356 kB
Word file 481 kB
2019-03-082019-05
TCDV
2019-03-282019-05
CCDV
47E/654/CDV PDF file 930 kB

PDF file 960 kB
2019-05-172019-05
PRVC
47E/707/RVC PDF file 337 kB
Word file 79 kB
2020-04-282019-08
AFDIS
2020-04-282020-04
DECFDIS
2020-04-29 
RFDIS
2020-05-052020-05
CFDIS
47E/711/FDIS PDF file 1354 kB
2020-06-192020-07
PRVD
 2020-07

Abstract

IEC 60747-17 ED1 specifies the terminology, essential ratings, characteristics, safety test and the measuring methods of magnetic coupler and capacitive coupler.
It specifies the principles and requirements of insulation and isolation characteristics for magnetic and capacitive couplers for basic insulation and reinforced insulation.
This first edition cancels and replaces IEC PAS 60747-17:2011. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to IEC PAS 60747-17:2011:

  1. introduced lifetime safety factors for improved life time consideration, to comply with widely recognized aging mechanisms of silicone dioxide (TDDB) and thin film polymer isolation layers;
  2. significantly improved "end of life testing" paragraph and statistical life time consideration by adding detailed description on process, safety factors, methods of generating data points and respective lifetime interpolations as well as being specific on minimum amount of samples required;
  3. introduced concept of certification by similarity, including Annex A, giving guidance on qualification considerations and required certification process;
  4. alternative pulse shape allowed for surge pulse testing, to avoid issues due to surge tester availability;
  5. various improvements throughout the standard: definitions, for example type of coupler have been improved, introduction of surge impulse VIMP rating, usage of glass transition temperature, pre-conditioning have been redefined for improved usability and better compatibility with today’s design and functionality of couplers, available mold compounds, etc.

Project

IEC 60747-17 ED1

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

 

Remark:

SMB/6186/DL - 3CD: 2017-07-31, FDIS: 2018-08-31

 

Associated Documents:

SMB/6186/DL

PDF file 474 kB