International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 5Mr KOJI YAMAGUCHIACD2022-03 

History

Stage
Document
Downloads
Decision Date
Target Date
prePNW
2019-05-10 
PNW
47/2577/NP  
2019-05-17 
PRVN
2019-08-092019-08
ACD
47/2606/RVN Word file 45 kB
PDF file 193 kB
2019-11-152019-12
CD
 2019-12

Project

IEC 63275-2 ED1

Semiconductor devices - Reliability test method for silicon carbide descrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation by body diode operating