International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56WG 3 WPUB2000-01 

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
56(DK)/31/NP  
1994-07-15 
ANW
56/429/RVN  
1994-11-30 
1CD
56/486/CD  
1995-10-271995-06
ACDV
56/517/CC  
1996-05-311996-04
CCDV
56/558/CDV  
1996-11-011997-04
AFDIS
56/623/RVC  
1998-02-131997-07
DECFDIS
1998-10-231998-06
RFDIS
1998-11-111998-11
CFDIS
56/654/FDIS
1999-01-291999-02
APUB
56/660/RVD PDF file 11 kB
1999-04-071999-04
BPUB
1999-04-081999-05
PPUB
1999-05-311999-06
WPUB
56/1198/MCR PDF file 62 kB
2007-05-11 
  

Abstract

Serves as an application guide to a reliability stress screening process for electronic hardware. The concept, purpose and justification of the screening process are explained. The standard is intended as a guide to be used with one of the IEC reliability stress screening standards. It gives guidance in cases where it is essential that early failures be removed from the items manufactured in order to deliver them to the customer when the problems causing the early failures are solved. It gives guidance on where the reliability stress screening should be carried out, i.e. component, subsystem or system level.

Project

IEC 60300-3-7:1999 ED1

Dependability management - Part 3-7: Application guide - Reliability stress screening of electronic hardware

 

 

Associated Documents:

56/883/DC

PDF file 61 kB
56/511/RM