TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56PT 2.6 Milena KrasichPPUB2003-102021

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
56/703/MCR PDF file 11 kB
2000-06-16 
1CD
56/774/CD PDF file 260 kB
2001-10-192001-03
ACDV
56/799/CC PDF file 226 kB
2002-05-172002-02
CCDV
56/800/CDV PDF file 465 kB
2002-05-242002-05
AFDIS
56/869/RVC PDF file 267 kB
2003-06-272003-01
DECFDIS
2003-10-222003-07
RFDIS
2003-10-272003-11
CFDIS
56/920/FDIS
2003-12-052004-01
APUB
56/939/RVD PDF file 236 kB
2004-02-132004-04
BPUB
2004-02-162004-05
PPUB
2004-03-242004-06
  

Abstract

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.

Project

IEC 61164:2004 ED2

Reliability growth - Statistical test and estimation methods

 

 

Associated Documents:

56/1828/DL

PDF file 143 kB
56/1810/INF

PDF file 107 kB
Word file 50 kB
56/1794/DC

PDF file 114 kB
56/1659/RM

PDF file 178 kB
56/1610/RM

PDF file 64 kB
56/1297/MCR

PDF file 21 kB
56/1013/RM

PDF file 118 kB