International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 91WG 3Mr Udo WelzelPPUB2019-052026

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
91/1392/RR PDF file 98 kB
2016-08-26 
ACD
2016-08-272016-08
CD
91/1422/CD PDF file 1030 kB
2017-01-062016-11
PCC
2017-03-312017-03
ACDV
91/1458/CC PDF file 861 kB
Word file 1314 kB
2017-08-042017-12
TCDV
2018-02-062018-02
CCDV
91/1495/CDV
PDF file 1143 kB
2018-03-302018-03
PRVC
2018-06-222018-06
AFDIS
91/1531A/RVC PDF file 275 kB
Word file 254 kB
2018-09-142018-12
TFDIS
2018-11-162018-12
DECFDIS
2018-12-202019-01
RFDIS
2019-01-092019-01
CFDIS
91/1562/FDIS

2019-02-222019-04
PRVD
2019-04-052019-04
APUB
91/1573/RVD PDF file 277 kB
2019-04-122019-04
BPUB
2019-04-122019-04
PPUB
2019-05-142019-05
  

Abstract

IEC 60068-2-82:2019 specifies tests for the whiskering propensity of surface finishes of electric or electronic components and mechanical parts such as punched/stamped parts (for example, jumpers, electrostatic discharge protection shields, mechanical fixations, press‑fit pins and other mechanical parts used in electronic assemblies) representing the finished stage, with tin or tin-alloy finish. Changes of the physical dimensions of mould compounds, plastics and the like during the required test flow are not considered or assessed. The test methods have been developed by using a knowledge-based approach.
This edition includes the following significant technical changes with respect to the previous edition:
– extension of the scope of the test standard from electronic to electromechanic components and press-fit pins, which are used for assembly and interconnect technology;
– significant reduction of the testing effort by a knowledge-based selection of test conditions i.e. tests not relevant for a given materials system can be omitted (see Annex D);
– harmonization with JESD 201A by omission of severities M, N for temperature cycling tests;
– highly reduced test duration (1 000 h instead of 4 000 h) for damp-heat test by introducing test condition at elevated humidity of 85 % R.H. and a temperature of 85 °C providing increased severity.

Project

IEC 60068-2-82:2019 ED2

Environmental testing - Part 2-82: Tests - Test Xw1: Whisker test methods for components and parts used in electronic assemblies

 

Remark:

Mr Ichizo Sakamoto is the other project leader.

 

Associated Documents:

91/1472/DL

PDF file 587 kB