International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 91WG 15 PPUB2007-092021

History

Stage
Document
Downloads
Decision Date
Target Date
CFDIS
93/249/FDIS
2007-06-15 
APUB
93/260/RVD PDF file 67 kB
2007-08-212007-09
BPUB
2007-08-31 
DECPUB
2007-09-05 
RFDIS
2007-09-13 
PPUB
2007-11-072007-11
  

Abstract

STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Project

IEC 62527:2007 ED1

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

 

 

Associated Documents:

93/317A/RM

PDF file 40 kB
93/313/DC

PDF file 24 kB