International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 91 |
Electronics assembly technology |
Detail
Committee | Working Groups | Project Leader | Current Status |
Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 91 | WG 3 | Mr Graham Naisbitt | TFDIS | 2020-05 | 2025 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2016-03-25 | ||||
| PRVN | 2016-05-20 | 2016-05 | ||||
| ACD |
| 2017-09-22 | 2017-11 | |||
| CD |
| 2017-09-29 | 2017-11 | |||
| PCC | 2017-12-22 | 2017-12 | ||||
| ACDV |
| 2018-08-24 | 2019-02 | |||
| TCDV | 2019-05-08 | 2019-06 | ||||
| CCDV |
| 2019-06-28 | 2019-06 | |||
| PRVC |
| 2019-09-20 | 2019-09 | |||
| AFDIS | 2019-11-06 | 2019-11 | ||||
| TFDIS | 2019-11-12 | |||||
| DECFDIS | 2019-12 | |||||
265 kBProject
IEC 61189-5-504 ED1
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 5-504: General test methods for materials and assemblies - Process ionic contamination testing (PICT)
Remark:
Mr Graham Naisbitt is the other project leader.
Target date of PRVN changed to 2017-01 based on decision taken at TC 91 meeting in Frankfurt, Germany 2016-10-14.
SMB/6550/DL - CDV: 2018-09-30
Associated Documents:
SMB/6550/DL
444 kBSMB/6250/DL
559 kB