TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 2Mr Jim LynchCCDV2021-112026

History

Stage
Document
Downloads
Decision Date
Target Date
ACDV
47/2625/RR PDF file 305 kB
2020-04-13 
TCDV
2020-09-292020-11
CCDV
47/2661/CDV
PDF file 2106 kB
2020-11-212020-11
CCDV
47/2661(F)/CDV PDF file 2237 kB
2020-11-212020-11
PRVC
 2021-02


Project

IEC 60749-28 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level