International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 77B

High frequency phenomena

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 77BJTF TEM A.C. MarvinPPUB2010-092020

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
77B/561/MCR PDF file 80 kB
2007-12-07 
1CD
77B/562/CD PDF file 901 kB
2007-12-142007-12
ACDV
77B/565A/CC Word file 240 kB
PDF file 188 kB
2008-04-112008-04
ACDV
77B/565B/CC Word file 241 kB
PDF file 190 kB
2008-11-142008-11
CCDV
77B/582/CDV PDF file 800 kB
PDF file 799 kB
2008-11-282008-12
AFDIS
77B/598A/RVC Word file 628 kB
PDF file 320 kB
2009-05-292009-07
DECFDIS
2010-03-252009-10
RFDIS
2010-04-072010-04
CFDIS
77B/637/FDIS

2010-05-282010-06
APUB
77B/641/RVD PDF file 87 kB
2010-08-032010-07
BPUB
2010-08-042010-08
PPUB
2010-08-312010-09
  

Abstract

IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe:
- TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations;
- TEM waveguide validation methods for EMC tests;
- the EUT (i.e. EUT cabinet and cabling) definition;
- test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and
- test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.
IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following:
- consistency of terms (e.g. test, measurement, etc.) has been improved;
- clauses covering test considerations, evaluations and the test report have been added;
- references to large TEM waveguides have been eliminated;
- a new informative annex has been added to deal with calibration of E-field probes.

Project

IEC 61000-4-20:2010 ED2

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

 

 

Associated Documents:

77B/819/DL

PDF file 103 kB
77B/789/RM

PDF file 313 kB
77B/709/RM

PDF file 159 kB