International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 119

Printed Electronics

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 119WG 5Mr An-Jung ChungPPUB2020-062025

History

Stage
Document
Downloads
Decision Date
Target Date
PWI
2014-11-08 
PNW
119/86/NP PDF file 619 kB
2015-11-13 
ANW
119/110/RVN PDF file 49 kB
2016-05-272016-03
ACD
119/110A/RVN PDF file 260 kB
2016-05-282016-05
CD
119/169/CD
PDF file 680 kB
2017-06-022017-03
PCC
2017-07-282017-07
ACDV
119/213/CC PDF file 431 kB
Word file 77 kB
2018-03-302018-08
CDM
119/213A/CC PDF file 430 kB
Word file 77 kB
2018-06-012018-10
ACDV
119/213B/CC PDF file 225 kB
Word file 85 kB
2018-12-142019-02
TCDV
2019-02-262019-04
CCDV
119/257/CDV
PDF file 638 kB
2019-04-192019-04
PRVC
2019-07-122019-07
AFDIS
119/289/RVC PDF file 187 kB
Word file 49 kB
2019-10-112019-11
TFDIS
2020-01-062019-11
DECFDIS
2020-01-092020-02
RFDIS
2020-01-302020-01
CFDIS
119/303/FDIS
2020-03-132020-04
PRVD
2020-04-242020-04
APUB
119/307/RVD PDF file 201 kB
2020-05-082020-05
BPUB
2020-05-082020-05
PPUB
2020-05-272020-06
  

Abstract

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

Project

IEC 62899-503-1:2020 ED1

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

 

Remark:

Mr Jinsoo Noh is the other project leader.