International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 49WG 10Mr Ken-ya HashimotoPPUB2020-052023

History

Stage
Document
Downloads
Decision Date
Target Date
prePNW
2017-05-23 
PNW
49/1231/NP PDF file 169 kB
2017-05-26 
PRVN
2017-08-182017-08
ACD
49/1247/RVN Word file 122 kB
PDF file 182 kB
2017-08-252017-12
CD
49/1280/CD
PDF file 432 kB
2018-03-302017-12
PCC
2018-06-222018-06
A2CD
49/1285/CC PDF file 190 kB
Word file 113 kB
2018-07-202018-12
A2CD
49/1285A/CC PDF file 189 kB
Word file 113 kB
2018-07-202018-12
2CD
49/1294/CD
PDF file 439 kB
2019-01-112018-12
PCC
2019-04-052019-04
ACDV
49/1297/CC PDF file 129 kB
Word file 33 kB
2019-05-032019-06
TCDV
2019-05-162019-07
CCDV
49/1305/CDV
PDF file 435 kB
2019-07-052019-07
PRVC
2019-09-272019-09
AFDIS
49/1324/RVC PDF file 171 kB
Word file 38 kB
2019-10-252019-12
TFDIS
2020-01-062019-12
DECFDIS
2020-01-092020-02
RFDIS
2020-01-302020-01
CFDIS
49/1339/FDIS
2020-02-282020-04
CFDIS
49/1339(F)/FDIS
2020-02-282020-04
PRVD
2020-04-102020-04
APUB
49/1342/RVD PDF file 162 kB
2020-04-172020-04
BPUB
2020-04-172020-04
PPUB
2020-04-242020-05
  

Abstract

IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.

Project

IEC 63155:2020 ED1

Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications