International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 113

Nanotechnology for electrotechnical products and systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 113PT 62607-6-14Mr Linde ZHANGPPUB2020-112022

History

Stage
Document
Downloads
Decision Date
Target Date
PWI
2016-10-27 
prePNW
2017-05-242017-10
PNW
113/364/NP PDF file 991 kB
2017-05-262017-06
PRVN
2017-08-182017-08
ACD
113/386/RVN PDF file 583 kB
2017-10-132018-05
CD
113/447/CD
PDF file 1233 kB
2018-11-092018-03
PCC
2019-01-042019-01
A2CD
113/460/CC PDF file 263 kB
Word file 57 kB
2019-03-012019-03
ADTS
113/460A/CC PDF file 261 kB
Word file 31 kB
2019-06-282019-07
TDTS
2019-07-112019-07
CDTS
113/495/DTS
2019-07-122019-08
PRVDTS
2019-10-042019-10
APUB
113/536/RVDTS PDF file 345 kB
Word file 52 kB
2020-04-102020-06
TPUB
2020-07-272020-06
DECPUB
2020-08-032020-09
RPUB
2020-08-122020-08
BPUB
2020-10-012020-11
PPUB
2020-10-272020-11
  

Abstract

IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
• defect level
for powders consisting of graphene-based material by
• Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D.
• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
• The method described in this document is appropriate if the physical form of graphene is powder.

Project

IEC TS 62607-6-14:2020 ED1

Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

 

 

Associated Documents:

SMB/6550/DL

PDF file 444 kB