International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 113

Nanotechnology for electrotechnical products and systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 113WG 3Mr Hiroyuki AkinagaBPUB2020-042022

History

Stage
Document
Downloads
Decision Date
Target Date
PWI
2015-02-11 
PNW
113/344/NP PDF file 1084 kB
2016-10-28 
PRVN
2017-01-202017-01
ACD
113/373/RVN Word file 16 kB
2017-08-182018-08
ACD
113/373A/RVN PDF file 470 kB
2017-08-182018-08
CD
113/448/CD
PDF file 3185 kB
2018-12-142018-08
PCC
2019-03-082019-03
CDM
113/468/CC PDF file 185 kB
Word file 69 kB
2019-05-172019-05
ADTS
113/468A/CC PDF file 239 kB
Word file 30 kB
2019-07-052019-07
TDTS
2019-07-082019-07
CDTS
113/493/DTS
2019-07-122019-08
PRVDTS
2019-10-042019-10
APUB
113/510/RVDTS PDF file 196 kB
Word file 35 kB
2019-10-112020-01
TPUB
2019-12-092020-01
DECPUB
2019-12-092020-01
RPUB
2019-12-192019-12
BPUB
2020-01-242020-03
PPUB
 2020-03

Abstract

There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
IEC TS 62607-8-1:2020 includes:
– outlines of the experimental procedures used to measure TSC,
– methods of interpretation of results and discussion of data analysis, and
– case studies.

Project

IEC TS 62607-8-1 ED1

Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current