International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 5 PRVN2022-03 

History

Stage
Document
Downloads
Decision Date
Target Date
prePNW
2019-05-10 
PNW
47/2577/NP  
2019-05-17 
PRVN
2019-08-092019-08
 2019-09

Project

PNW 47-2577

Semiconductor devices - Reliability test method for silicon carbide descrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation by body diode operating