International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 91WG 15 PPUB2007-092021

History

Stage
Document
Downloads
Decision Date
Target Date
CFDIS
93/247/FDIS
2007-06-15 
APUB
93/258/RVD PDF file 67 kB
2007-08-212007-09
BPUB
2007-08-31 
DECPUB
2007-09-05 
RFDIS
2007-09-13 
PPUB
2007-11-072007-11
  

Abstract

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Project

IEC 62525:2007 ED1

Standard Test Interface Language (STIL) for Digital Test Vector Data

 

 

Associated Documents:

93/306/RM

PDF file 48 kB