International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 6Mr Deok-kee KimPRVN2022-07 

History

Stage
Document
Downloads
Decision Date
Target Date
prePNW
2019-11-28 
PNW
47/2610/NP PDF file 795 kB
2019-12-06 
PRVN
2020-02-282020-02
 2020-03


Project

PNW 47-2610

Future IEC 62951-9: Semiconductor devices - Flexible and strechable semiconductor devices – Part 9: Performance and reliability testing methods of  one transistor and one resistor (1T1R) resistive memory cells