International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 91WG 15 PPUB2012-052026

History

Stage
Document
Downloads
Decision Date
Target Date
CFDIS
93/321/FDIS
2011-12-09 
APUB
93/328/RVD PDF file 22 kB
2012-02-132012-03
DECPUB
2012-02-132012-03
BPUB
2012-02-14 
RPUB
2012-05-25 
PPUB
2012-06-212012-03
  

Abstract

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

Project

IEC 61445:2012 ED1

Digital Test Interchange Format (DTIF)