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TC 119

Printed Electronics
 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 119WG 4Mr Chung-Hwan KimPPUB2021-052026

History

Stage
Document
Downloads
Decision Date
Target Date
prePNW
2018-11-01 
PNW
119/243/NP PDF file 2647 kB
2018-11-09 
PRVN
2019-02-012019-02
ACD
119/259/RVN Word file 92 kB
PDF file 362 kB
2019-03-012019-11
CD
119/277/CD
PDF file 2578 kB
2019-07-052019-11
PCC
2019-09-272019-09
ACDV
119/291/CC PDF file 336 kB
Word file 61 kB
2019-11-222019-12
TCDV
2019-12-302020-02
CCDV
119/298/CDV
PDF file 2352 kB
2020-02-212020-02
PRVC
2020-05-152020-05
AFDIS
119/343/RVC PDF file 209 kB
Word file 58 kB
2020-12-182021-01
DECFDIS
2021-01-042021-01
RFDIS
2021-01-062021-01
CFDIS
119/346/FDIS
2021-02-052021-03
PRVD
2021-03-192021-03
APUB
119/350/RVD PDF file 147 kB
2021-03-262021-04
BPUB
2021-03-262021-03
PPUB
2021-04-072021-05
  

Abstract

IEC 62899-402-3:2021(E) specifies the optical measurement method for acquiring two-dimensional images of voids and obtaining the void-related attributes in the dried or cured printed patterns which are part of the electronic products in the field of printed electronics. The measurable voids using this document are limited to those that are distinguishable by the optical image measurement.
NOTE In this document, void means an imperfection of pattern observed from a two-dimensional (2D) top-view.

Project

IEC 62899-402-3:2021 ED1

Printed electronics - Part 402-3: Printability - Measurement of qualities - Voids in printed pattern using a two-dimensional optical image