International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47A

Integrated circuits

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47AWG 9 J. ShepherdPPUB2014-082022

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47A/877A/NP PDF file 467 kB
2011-12-27 
ANW
47A/884A/RVN PDF file 227 kB
2012-05-292012-05
1CD
47A/887/CD PDF file 453 kB
2012-06-272012-05
A2CD
47A/895/CC Word file 158 kB
PDF file 177 kB
2012-10-312012-11
2CD
47A/898/CD PDF file 322 kB
2013-01-022013-02
A3CD
47A/902/CC Word file 136 kB
PDF file 150 kB
2013-05-222013-05
3CD
47A/903/CD PDF file 240 kB
2013-05-312013-06
ACDV
47A/917/CC Word file 116 kB
PDF file 116 kB
2013-10-182013-10
CDTS
47A/924/DTS PDF file 249 kB
PDF file 312 kB
2014-01-152013-12
APUB
47A/936/RVC Word file 95 kB
PDF file 53 kB
2014-06-272014-07
DECPUB
2014-07-022014-10
BPUB
2014-07-112014-07
RPUB
2014-07-14 
PPUB
2014-08-212014-11
  

Abstract

IEC TS 62132-9:2014 provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. This test procedure is applicable to testing an IC mounted on any circuit board that is accessible to the scanning probe. In some cases it is useful to scan not only the IC but also its environment. For comparison of surface scan immunity between different ICs, the standardized test board defined in IEC 62132-1 should be used. This measurement method provides a mapping of the sensitivity (immunity) to electric- or magnetic-near-field disturbance over the IC. The resolution of the test is determined by the capability of the test probe and the precision of the Probe-positioning system. This method is intended for use up to 6 GHz. Extending the upper limit of frequency is possible with existing probe technology but is beyond the scope of this specification. The tests described in this document are carried out in the frequency domain using continuous wave (CW), amplitude modulated (AM) or pulse modulated (PM) signals.

Project

IEC TS 62132-9:2014 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method