International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47A

Integrated circuits

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47AWG 9 Dr. Frank KlotzPPUB2013-062021

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47A/815/NP PDF file 226 kB
2009-04-24 
ANW
47A/829A/RVN PDF file 227 kB
2009-09-112009-09
1CD
47A/839/CD PDF file 406 kB
2010-02-052010-06
CDM
47A/846/CC Word file 360 kB
PDF file 390 kB
2010-05-282010-06
A2CD
47A/846A/CC PDF file 210 kB
2010-11-192010-11
2CD
47A/864/CD PDF file 430 kB
2011-04-012011-10
CDM
47A/871/CC Word file 124 kB
PDF file 279 kB
2011-07-152011-10
ACDV
47A/871A/CC Word file 144 kB
PDF file 146 kB
2011-10-182011-11
CCDV
47A/881/CDV PDF file 455 kB
PDF file 461 kB
2012-02-292012-01
APUB
47A/890/RVC Word file 105 kB
PDF file 117 kB
2012-08-082012-10
DECPUB
2013-04-012013-01
BPUB
2013-04-052013-04
RPUB
2013-05-01 
PPUB
2013-07-172013-08
  

Abstract

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

Project

IEC 62215-3:2013 ED1

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method