TC 113 |
Nanotechnology for electrotechnical products and systems |
Detail
Committee | Working Groups | Project Leader | Current Status |
Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 113 | PT 62876-2-1 | Mr Jens Andreas Hauch | PPUB | 2018-09 | 2024 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PWI | 2012-10-21 | |||||
| PNW |
| 2012-12-21 | ||||
| ANW |
| 2013-05-10 | 2013-05 | |||
| ANW |
| 2013-05-10 | 2013-05 | |||
| CDTS |
| 2016-08-19 | 2016-06 | |||
| PRVDTS | 2016-11-11 | 2016-11 | ||||
| APUB |
| 2018-04-13 | 2018-07 | |||
| TPUB | 2018-04-16 | 2018-07 | ||||
| DECPUB | 2018-04-23 | 2018-06 | ||||
| RPUB | 2018-05-17 | 2018-05 | ||||
| BPUB | 2018-08-02 | 2018-08 | ||||
| PPUB | 2018-08-29 | 2018-09 | ||||
300 kB
91 kBAbstract
IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.