International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47EPT 60747-14-11Mr Kunnyun KimTCDV2020-112025

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47E/550/NP PDF file 3068 kB
2016-07-29 
PRVN
2016-10-212016-10
ACD
47E/573/RVN Word file 61 kB
PDF file 138 kB
2017-06-022017-11
CD
47E/604/CD
PDF file 2487 kB
2018-03-232018-03
PCC
2018-06-152018-06
CDM
47E/626/CC PDF file 248 kB
Word file 218 kB
2018-09-142018-10
CDM
47E/626A/CC PDF file 285 kB
Word file 266 kB
2018-09-142018-10
ACD
2019-01-022019-01
2CD
47E/639/CD
PDF file 1224 kB
2019-01-11 
PCC
2019-03-082019-03
ACDV
47E/667/CC PDF file 163 kB
Word file 38 kB
2019-07-122019-09
TCDV
2019-08-052019-09
CCDV
 2019-09

Project

IEC 60747-14-11 ED1

Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature