International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 2Mr Jim LynchAFDIS2020-102025

History

Stage
Document
Downloads
Decision Date
Target Date
ACDV
47/2572/RR PDF file 86 kB
2019-05-03 
TCDV
2019-05-132019-07
CCDV
47/2575/CDV
PDF file 240 kB
PDF file 243 kB
2019-07-052019-07
PRVC
2019-09-272019-09
AFDIS
47/2604/RVC PDF file 177 kB
Word file 44 kB
2019-11-152020-02
TFDIS
 2020-02

Project

IEC 60749-15 ED3

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices