TC 113 |
Nanotechnology for electrotechnical products and systems |
Detail
Committee | Working Groups | Project Leader | Current Status |
Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 113 | PT 62607-6-14 | Mr Linde ZHANG | PPUB | 2020-11 | 2022 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PWI | 2016-10-27 | |||||
| prePNW | 2017-05-24 | 2017-10 | ||||
| PNW |
| 2017-05-26 | 2017-06 | |||
| PRVN | 2017-08-18 | 2017-08 | ||||
| ACD |
| 2017-10-13 | 2018-05 | |||
| CD |
| 2018-11-09 | 2018-03 | |||
| PCC | 2019-01-04 | 2019-01 | ||||
| A2CD |
| 2019-03-01 | 2019-03 | |||
| ADTS |
| 2019-06-28 | 2019-07 | |||
| TDTS | 2019-07-11 | 2019-07 | ||||
| CDTS |
| 2019-07-12 | 2019-08 | |||
| PRVDTS | 2019-10-04 | 2019-10 | ||||
| APUB |
| 2020-04-10 | 2020-06 | |||
| TPUB | 2020-07-27 | 2020-06 | ||||
| DECPUB | 2020-08-03 | 2020-09 | ||||
| RPUB | 2020-08-12 | 2020-08 | ||||
| BPUB | 2020-10-01 | 2020-11 | ||||
| PPUB | 2020-10-27 | 2020-11 | ||||
57 kBAbstract
IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
• defect level
for powders consisting of graphene-based material by
• Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D.
• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
• The method described in this document is appropriate if the physical form of graphene is powder.
• defect level
for powders consisting of graphene-based material by
• Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D.
• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
• The method described in this document is appropriate if the physical form of graphene is powder.
Project
IEC TS 62607-6-14:2020 ED1
Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy
Associated Documents:
SMB/6550/DL
444 kB