TC 113

Nanotechnology for electrotechnical products and systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 113PT 62607-6-14Mr Linde ZHANGPPUB2020-112022

History

Stage
Document
Downloads
Decision Date
Target Date
PWI
2016-10-27 
prePNW
2017-05-242017-10
PNW
113/364/NP PDF file 991 kB
2017-05-262017-06
PRVN
2017-08-182017-08
ACD
113/386/RVN PDF file 583 kB
2017-10-132018-05
CD
113/447/CD
PDF file 1233 kB
2018-11-092018-03
PCC
2019-01-042019-01
A2CD
113/460/CC PDF file 263 kB
Word file 57 kB
2019-03-012019-03
ADTS
113/460A/CC PDF file 261 kB
Word file 31 kB
2019-06-282019-07
TDTS
2019-07-112019-07
CDTS
113/495/DTS
2019-07-122019-08
PRVDTS
2019-10-042019-10
APUB
113/536/RVDTS PDF file 345 kB
Word file 52 kB
2020-04-102020-06
TPUB
2020-07-272020-06
DECPUB
2020-08-032020-09
RPUB
2020-08-122020-08
BPUB
2020-10-012020-11
PPUB
2020-10-272020-11
  

Abstract

IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
• defect level
for powders consisting of graphene-based material by
• Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D.
• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
• The method described in this document is appropriate if the physical form of graphene is powder.

Project

IEC TS 62607-6-14:2020 ED1

Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

 

 

Associated Documents:

SMB/6550/DL

PDF file 444 kB