International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 113

Nanotechnology for electrotechnical products and systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 113PT 62607-5-3Mr Kei NodaPPUB2020-042022

History

Stage
Document
Downloads
Decision Date
Target Date
prePNW
2017-01-24 
PNW
113/352/NP PDF file 1087 kB
2017-01-27 
PRVN
2017-04-212017-04
ACD
113/367/RVN Word file 94 kB
PDF file 178 kB
2017-06-022018-05
ACD
113/367A/RVN PDF file 377 kB
2017-06-022018-05
CD
113/432/CD
PDF file 1012 kB
2018-06-292018-05
PCC
2018-08-242018-08
A2CD
113/446/CC PDF file 234 kB
Word file 58 kB
2018-11-092018-12
ADTS
113/446A/CC PDF file 231 kB
Word file 99 kB
2019-06-072019-06
TDTS
2019-06-112019-06
CDTS
113/477/DTS
2019-06-142019-07
PRVDTS
2019-09-062019-09
APUB
113/523/RVDTS PDF file 306 kB
Word file 128 kB
2019-12-132020-02
TPUB
2020-01-062020-02
DECPUB
2020-01-072020-02
RPUB
2020-02-172020-01
BPUB
2020-03-162020-05
PPUB
2020-04-142020-04
  

Abstract

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

Project

IEC TS 62607-5-3:2020 ED1

Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration