International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56PT 2.6 Milena KrasichPPUB2003-102021

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
56/703/MCR PDF file 11 kB
2000-06-16 
1CD
56/774/CD PDF file 260 kB
2001-10-192001-03
ACDV
56/799/CC PDF file 226 kB
2002-05-172002-02
CCDV
56/800/CDV PDF file 465 kB
2002-05-242002-05
AFDIS
56/869/RVC PDF file 267 kB
2003-06-272003-01
DECFDIS
2003-10-222003-07
RFDIS
2003-10-272003-11
CFDIS
56/920/FDIS
2003-12-052004-01
APUB
56/939/RVD PDF file 236 kB
2004-02-132004-04
BPUB
2004-02-162004-05
PPUB
2004-03-242004-06
  

Abstract

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.

Project

IEC 61164:2004 ED2

Reliability growth - Statistical test and estimation methods

 

 

Associated Documents:

56/1828/DL

PDF file 143 kB
56/1810/INF

PDF file 107 kB
Word file 50 kB
56/1794/DC

PDF file 114 kB
56/1659/RM

PDF file 178 kB
56/1610/RM

PDF file 64 kB
56/1297/MCR

PDF file 21 kB
56/1013/RM

PDF file 118 kB