Electronics assembly technology
|TC 91||WG 3||I. Sakamoto||DELPUB||2007-07||2023|
IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable. The contents of the corrigendum of December 2009 have been included in this copy.
IEC 60068-2-82:2007 ED1
Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components
91/848/DC 46 kB