International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 91WG 3 I. SakamotoDELPUB2007-072023

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
91/443/NP PDF file 578 kB
2004-03-05 
ANW
91/510/RVN PDF file 239 kB
2005-01-142004-07
1CD
91/517/CD PDF file 506 kB
2005-04-292005-06
CDM
91/543/CC PDF file 3179 kB
2005-08-262005-08
ACDV
91/543A/CC PDF file 2093 kB
2005-11-182005-10
CCDV
91/570/CDV PDF file 2012 kB
2005-12-022005-11
CDVM
91/606/RVC PDF file 290 kB
2006-05-122006-07
AFDIS
91/606A/RVC PDF file 287 kB
2006-10-202006-08
DECFDIS
2007-01-102006-11
RFDIS
2007-01-162007-01
CFDIS
91/651/FDIS
2007-03-022007-04
APUB
91/685/RVD PDF file 101 kB
2007-05-102007-07
BPUB
2007-05-112007-05
PPUB
2007-05-232007-07
DELPUB
2019-05-14 
WPUB
  

Abstract

IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable. The contents of the corrigendum of December 2009 have been included in this copy.

Project

IEC 60068-2-82:2007 ED1

Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components

 

 

Associated Documents:

91/871/INF

PDF file 44 kB
91/848/DC

PDF file 46 kB