|SC 47A||Mr Wonjong KIM||PWI|| |
Semiconductor devices – Fault test method for automotive vehicles – Part 2 Electromagnetic Susceptibility from automotive RADAR
This part of IEC xxxxx standard is to provide a test procedure, which defines a method for testing faults on semiconductor devices used in automotive vehicles which may be caused electromagnetic waves generated from automotive RADAR in other vehicles. This test procedure is applicable to testing a semiconductor device or an IC mounted on any circuit board that is accessible to the test probe. This technique is capable of providing a detailed test report of the semiconductor device or the IC sensitive to electromagnetic wave generated from currently used automotive RADARs using frequencies around 24, 77, or 77~81 GHz.