TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 2Mr Jim LynchCCDV2021-122026

History

Stage
Document
Downloads
Decision Date
Target Date
ACDV
47/2649/RR PDF file 122 kB
2020-08-20 
TCDV
2020-08-312020-10
CCDV
47/2651/CDV
PDF file 1098 kB
PDF file 1092 kB
2020-10-232020-10
PRVC
 2021-01


Project

IEC 60749-37 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer