TC 119 |
Printed Electronics |
Detail
Committee | Working Groups | Project Leader | Current Status |
Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 119 | WG 5 | Mr Takehito Kozasa | AFDIS | 2021-10 | 2026 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| prePNW | 2018-12-11 | |||||
| PNW |
| 2018-12-14 | ||||
| PRVN | 2019-02-08 | 2019-02 | ||||
| ACD |
| 2019-03-15 | 2019-10 | |||
| CD |
| 2019-08-09 | 2019-10 | |||
| PCC | 2019-10-04 | 2019-10 | ||||
| ACDV |
| 2019-11-22 | 2020-01 | |||
| TCDV | 2019-12-31 | 2020-02 | ||||
| CCDV |
| 2020-02-21 | 2020-02 | |||
| PRVC | 2020-05-15 | 2020-05 | ||||
| AFDIS |
| 2021-02-26 | 2021-03 | |||
| DECFDIS | 2021-03 | |||||
472 kB
65 kBProject
IEC 62899-503-3 ED1
Printed electronics- Part 503-3 : Quality assessment - Measuring method of contact resistance for the printed thin film transistor by transfer length method