SC 46F

RF and microwave passive components

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 46FWG 1Mr Masahiro HoribeBPUB2021-012022

History

Stage
Document
Downloads
Decision Date
Target Date
prePNW
2017-09-11 
PNW
46F/386/NP PDF file 549 kB
2017-09-15 
PRVN
2017-12-082017-12
ACD
46F/406/RVN Word file 144 kB
PDF file 309 kB
2018-02-162018-02
CD
46F/415/CD
PDF file 534 kB
2018-05-042018-02
PCC
2018-07-272018-07
ACDV
46F/431/CC PDF file 152 kB
Word file 51 kB
2018-08-312018-11
TCDV
2019-02-152019-04
CCDV
46F/451/CDV
PDF file 506 kB
PDF file 505 kB
2019-04-052019-04
PRVC
2019-06-282019-06
AFDIS
46F/475/RVC PDF file 359 kB
Word file 67 kB
2019-07-122019-09
TFDIS
2019-09-232019-09
DECFDIS
2019-11-042019-11
RFDIS
2019-11-202019-11
CFDIS
46F/523/FDIS

2020-09-252020-02
PRVD
2020-11-062020-11
APUB
46F/531/RVD PDF file 183 kB
2020-11-212020-11
BPUB
2020-11-212020-11
PPUB
 2021-01

Abstract

IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.


Project

IEC 63185 ED1

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method