International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56 Milena KrasichPPUB2012-052022

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
56/1308/MCR PDF file 30 kB
2008-12-19 
CCDV
56/1347/CDV PDF file 1305 kB
PDF file 1321 kB
2009-11-062009-11
AFDIS
56/1370/RVC Word file 976 kB
PDF file 693 kB
2010-05-282010-07
AFDIS
56/1370A/RVC Word file 856 kB
PDF file 647 kB
2010-05-282010-07
DECFDIS
2011-11-152011-11
RFDIS
2011-11-222011-11
CFDIS
56/1461/FDIS

2012-01-272012-02
APUB
56/1468/RVD PDF file 163 kB
2012-04-022012-03
BPUB
2012-04-032012-04
PPUB
2012-05-232012-05
 2019-10

Abstract

IEC 61124:2012 gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of: failure rate, failure intensity, meantime to failure (MTTF), and mean operating time between failures (MTBF). The main changes with respect to the previous edition are as follows:
- A number of new test plans have been added based on the Russian standard GOST R 27.402 [1], and it is intended to align the new edition of MIL-HDBK-781 [2] with this edition. Algorithms for optimizing test plans using a spreadsheet program are given and a number of optimized test plans are listed. Furthermore, emphasis is laid on the fact that the test should be repeated following design changes;
- Discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7 [3], now withdrawn, have been corrected so these test plans differ from those given in previous editions of IEC 61124. As requested by the National Committees, mathematical background material and spreadsheet program information has been moved to informative annexes. In addition, the symbol lists have been divided, so that some annexes have separate lists of symbols;
- Guidance on how to choose test plans has been added as well as guidance on how to use spreadsheet programs to create them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected;
- Subcluses 8.1, 8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged, except for updated terminology and references. The contents of the corrigendum of January 2013 have been included in this copy.

Project

IEC 61124:2012 ED3

Reliability testing - Compliance tests for constant failure rate and constant failure intensity

 

 

Associated Documents:

56/1858/RR

PDF file 84 kB
56/1828/DL

PDF file 143 kB
56/1729A/Q

PDF file 51 kB
56/1717/RM

PDF file 166 kB
56/1659/RM

PDF file 178 kB
56/1342/INF

PDF file 20 kB
SMB/4630/DL

PDF file 266 kB
SMB/4114/DL

PDF file 173 kB