SC 47E

Discrete semiconductor devices

 
export to xls file

SC 47E Working Documents since 2019-12-03

Reference, Title
Downloads

Circulation

Date

Closing

Date

CENELEC

Voting /

Comment

Of interest to

Committees

47E/700A/CC

Revised Compilation of Comments on 47E/687/CD - IEC 60747-5-4 ED2: Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

2020-11-27 N
SC 86C
47E/720A/CC

Revised Compilation of Comments on 47E/710/CD - IEC TR 60747-5-12 ED1: Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

2020-11-27 N
47E/730/CC

Compilation of Comments on 47E/716/CD - IEC 60747-5-14 ED1: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

2020-11-27 N
47E/731/CC

Compilation of Comments on 47E/717/CD - IEC 60747-5-15 ED1: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy

2020-11-27 N
47E/726/CDV

IEC 60747-8/AMD1 ED3: Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

2020-11-13 2021-02-05 N
47E/724A/DA

Revised draft agenda of the SC 47E online plenary meeting on 19th November 2020 (14.00h – 17.00h @CET)

2020-10-16 N/A
47E/729/INF

Review of Active Participation of P-members in the Work of  47E

2020-10-16 N/A
47E/727/CC

Compilation of Comments on 47E/698/CD - IEC 60747-16-7 ED1: Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

2020-10-09 Y
47E/728/CC

Compilation of Comments on 47E/699/CD - IEC 60747-16-8 ED1: Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

2020-10-09 Y
47E/721/RVC

Result of Voting on 47E/701/CDV - IEC 60747-5-6 ED2: Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

2020-09-25 N
SC 34A
47E/722/RVC

Result of Voting on 47E/702/CDV - IEC 60747-5-13 ED1: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

2020-09-25 N
SC 34A
47E/723/DC

Maintenance – call for comments or proposals on the publications which need to be reviewed and a call for experts

2020-09-25 2020-11-06 N/A Report of Comments
47E/724/DA

Draft agenda of the SC 47E online plenary meeting on 19th November 2020 (14.00h – 17.00h @CET)

2020-09-25 N/A
47E/725/NP

PNW 47E-725 ED1: Semiconductor devices – Part 16-9: Microwave integrated circuits – Phase Shifters

2020-09-25 2020-12-18 U
47E/718/NP

PNW 47E-718 ED1: Semiconductor devices – Part 18-4: Semiconductor bio sensors – Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

2020-09-11 2020-12-04 U
47E/719/NP

PNW 47E-719 ED1: Semiconductor devices – Part 18-5: Semiconductor bio sensors – Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light

2020-09-11 2020-12-04 U
47E/716/CD

IEC 60747-5-14 ED1: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

2020-08-28 2020-10-23 N Report of Comments
47E/717/CD

IEC 60747-5-15 ED1: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy

2020-08-28 2020-10-23 N Report of Comments
47E/715/RVD

Result of Voting on 47E/711/FDIS - IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

2020-08-14 Y
47E/712A/RVN

Revised Result of Voting on 47E/703/NP - PNW 47E-703: Future IEC 60747-5-14: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the junction temperature based on the thermoreflectance method

2020-07-17 N
47E/713A/RVN

Revised Result of Voting on 47E/704/NP - PNW 47E-704: Future IEC 60747-5-15: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the internal electric field based on the electroreflectance spectroscopy

2020-07-17 N
47E/714/RVD

Result of Voting on 47E/706/FDIS - IEC 60747-5-5 ED2: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

2020-06-26 Y
47E/711/FDIS

IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

2020-06-19 2020-07-31 Y Voting Result
47E/712/RVN

Result of Voting on 47E/703/NP - PNW 47E-703: Future IEC 60747-5-14: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the junction temperature based on the thermoreflectance method

2020-06-19 N
47E/713/RVN

Result of Voting on 47E/704/NP - PNW 47E-704: Future IEC 60747-5-15: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the internal electric field based on the electroreflectance spectroscopy

2020-06-19 N
47E/709/RVC

Result of Voting on 47E/674/CDV - IEC 60747-14-11 ED1: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

2020-05-29 N
TC 49
47E/710/CD

IEC TR 60747-5-12 ED1: Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

2020-05-29 2020-08-21 N Report of Comments
47E/708/CC

Compilation of Comments on 47E/669/CD - IEC 60747-8/AMD1 ED3: Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

2020-05-15 N
47E/706/FDIS

IEC 60747-5-5 ED2: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

2020-05-01 2020-06-12 Y Voting Result
47E/707/RVC

Result of Voting on 47E/654/CDV - IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

2020-05-01 Y
47E/701/CDV

IEC 60747-5-6 ED2: Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

2020-04-17 2020-07-10 N Voting Result
SC 34A
47E/702/CDV

IEC 60747-5-13 ED1: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

2020-04-17 2020-07-10 N Voting Result
SC 34A
47E/705/RVC

Result of Voting on 47E/673/CDV - IEC 60747-16-5/AMD1 ED1: Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

2020-03-06 N/A
47E/698/CD

IEC 60747-16-7 ED1: Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

2020-02-28 2020-05-22 Y Report of Comments
47E/699/CD

IEC 60747-16-8 ED1: Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

2020-02-28 2020-05-22 Y Report of Comments
47E/703/NP

PNW 47E-703: Future IEC 60747-5-14: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the junction temperature based on the thermoreflectance method

2020-02-28 2020-05-22 N Voting Result
47E/704/NP

PNW 47E-704: Future IEC 60747-5-15: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the internal electric field based on the electroreflectance spectroscopy

2020-02-28 2020-05-22 N Voting Result
47E/695/RVN

Result of Voting on 47E/670/NP - PNW 47E-670: Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

2020-02-21 Y
47E/696/RVN

Result of Voting on 47E/671/NP - PNW 47E-671: Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

2020-02-21 Y
47E/697/RVC

Result of Voting on 47E/655/CDV - IEC 60747-5-5 ED2: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

2020-02-21 Y
47E/694/RVD

Result of Voting on 47E/689/FDIS - IEC 60747-18-2 ED1: Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules

2019-12-27 N