SC 47E

Result of Voting on 47E/741/DTR - IEC TR 60747-5-12 ED1: Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

Result of Voting on 47E/725/NP - PNW 47E-725 ED1: Semiconductor devices – Part 16-9: Microwave integrated circuits – Phase Shifters

IEC 60747-5-13 ED1: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

IEC 60747-5-6 ED2: Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

IEC 60747-5-15 ED1: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy

PNW 47E-743 ED1: Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the photocurrent spectroscopy

Result of Voting on 47E/726/CDV - IEC 60747-8/AMD1 ED3: Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

PNW 47E-743 ED1: Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the photocurrent spectroscopy

Result of Voting on 47E/693/DTS - IEC TS 60747-19-2 ED1: Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of smart sensors and power supplies to drive smart sensors

IEC 60747-5-14 ED1: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

Replaced by 47E/737A/CDV

IEC 60747-5-4 ED2: Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

Revised Result of Voting on 47E/701/CDV - IEC 60747-5-6 ED2: Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

IEC TR 60747-5-12 ED1: Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

Result of Voting on 47E/718/NP - PNW 47E-718 ED1: Semiconductor devices – Part 18-4: Semiconductor bio sensors – Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

Result of Voting on 47E/719/NP - PNW 47E-719 ED1: Semiconductor devices – Part 18-5: Semiconductor bio sensors – Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light

IEC 60747-16-7 ED1: Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

IEC 60747-16-8 ED1: Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

Unconfirmed minutes of the IEC/SC 47E meeting on Nov. 19^th, 2020 (on-line, UTC 13:00)

Revised Result of Voting on 47E/702/CDV - IEC 60747-5-13 ED1: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

List of decisions taken at the meeting of SC47E, held online on 19^th November 2020

Revised Compilation of Comments on 47E/687/CD - IEC 60747-5-4 ED2: Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

Revised Compilation of Comments on 47E/710/CD - IEC TR 60747-5-12 ED1: Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

Compilation of Comments on 47E/716/CD - IEC 60747-5-14 ED1: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

Compilation of Comments on 47E/717/CD - IEC 60747-5-15 ED1: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy

IEC 60747-8/AMD1 ED3: Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

Revised draft agenda of the SC 47E online plenary meeting on 19^th November 2020 (14.00h – 17.00h @CET)

Review of Active Participation of P-members in the Work of  47E

Compilation of Comments on 47E/698/CD - IEC 60747-16-7 ED1: Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

Compilation of Comments on 47E/699/CD - IEC 60747-16-8 ED1: Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

Result of Voting on 47E/701/CDV - IEC 60747-5-6 ED2: Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

Result of Voting on 47E/702/CDV - IEC 60747-5-13 ED1: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

Maintenance – call for comments or proposals on the publications which need to be reviewed and a call for experts

Draft agenda of the SC 47E online plenary meeting on 19^th November 2020 (14.00h – 17.00h @CET)

PNW 47E-725 ED1: Semiconductor devices – Part 16-9: Microwave integrated circuits – Phase Shifters

PNW 47E-718 ED1: Semiconductor devices – Part 18-4: Semiconductor bio sensors – Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

PNW 47E-719 ED1: Semiconductor devices – Part 18-5: Semiconductor bio sensors – Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light

IEC 60747-5-14 ED1: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

IEC 60747-5-15 ED1: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy

Result of Voting on 47E/711/FDIS - IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

Revised Result of Voting on 47E/703/NP - PNW 47E-703: Future IEC 60747-5-14: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the junction temperature based on the thermoreflectance method

Revised Result of Voting on 47E/704/NP - PNW 47E-704: Future IEC 60747-5-15: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the internal electric field based on the electroreflectance spectroscopy

Result of Voting on 47E/706/FDIS - IEC 60747-5-5 ED2: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

Result of Voting on 47E/703/NP - PNW 47E-703: Future IEC 60747-5-14: Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the junction temperature based on the thermoreflectance method

Result of Voting on 47E/704/NP - PNW 47E-704: Future IEC 60747-5-15: Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the internal electric field based on the electroreflectance spectroscopy

Result of Voting on 47E/674/CDV - IEC 60747-14-11 ED1: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

IEC TR 60747-5-12 ED1: Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

Compilation of Comments on 47E/669/CD - IEC 60747-8/AMD1 ED3: Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

IEC 60747-5-5 ED2: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

Result of Voting on 47E/654/CDV - IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation