SC 47F

Micro-electromechanical systems

 
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SC 47F Working Documents since 2020-05-11

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Date

Closing

Date

CENELEC

Voting /

Comment

Of interest to

Committees

47F/379/RVC

Result of Voting on 47F/372/CDV - IEC 62047-40 ED1: Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

2021-05-07 N
47F/376(F)/FDIS

IEC 62047-41 ED1: Semiconductor devices - Micro-electromechanical devices – Part 41: RF MEMS circulators and isolators

2021-04-30 2021-05-14 N
47F/377/RVN

Result of Voting on 47F/375/NP - PNW 47F-375 ED1: Semiconductor devices – Micro-electromechanical devices – Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices

2021-04-16 U
47F/378/FDIS

IEC 62047-38 ED1: Semiconductor devices – Micro-electromechanical devices – Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection

2021-04-16 2021-05-28 N
47F/376/FDIS

IEC 62047-41 ED1: Semiconductor devices - Micro-electromechanical devices – Part 41: RF MEMS circulators and isolators

2021-04-02 2021-05-14 N
47F/372/CDV

IEC 62047-40 ED1: Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

2021-02-05 2021-04-30 N Voting Result
47F/375/NP

PNW 47F-375 ED1: Semiconductor devices – Micro-electromechanical devices – Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices

2021-01-15 2021-04-09 U Voting Result
47F/374/RVC

Result of Voting on 47F/364/CDV - IEC 62047-41 ED1: Semiconductor devices - Micro-electromechanical devices – Part 41: RF MEMS Circulators and Isolators

2021-01-08 N
47F/373/RVN

Result of Voting on 47F/366/NP - PNW 47F-366 ED1: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

2021-01-01 N
TC 49
47F/370/RVC

Result of Voting on 47F/363/CDV - IEC 62047-38 ED1: Semiconductor devices – Micro-electromechanical devices – Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection

2020-12-11 N
47F/371/RM

Unconfirmed minutes of SC 47F plenary meeting held Online, on November 19, 2020, from 11:00to 13:00 in UTC time zone

2020-12-11 N/A
47F/365A/CC

Revised Compilation of Comments on 47F/360/CD - IEC 62047-40 ED1: Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

2020-12-04 N
47F/369/DL

List of decisions taken at the meeting of SC 47F, held in Online, on 19 November 2020

2020-11-27 N/A
47F/362A/DA

Revised draft agenda for the meeting to be held in Frankfurt, Germany, on 2020-11-19 (starting time: 9:00 to approximate finishing time: 12:00)

2020-10-02 N/A
47F/364/CDV

IEC 62047-41 ED1: Semiconductor devices - Micro-electromechanical devices – Part 41: RF MEMS Circulators and Isolators

2020-10-02 2020-12-25 N Voting Result
47F/367/INF

Report of comments on 47F/361/DC: Maintenance – call for comments/ proposals on publications coming up for review and a call for experts

2020-10-02 N/A
47F/368/INF

Review of Active Participation of P-members in the Work of  47F

2020-10-02 N/A
47F/366/NP

PNW 47F-366 ED1: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

2020-09-25 2020-12-18 N Voting Result
TC 49
47F/363/CDV

IEC 62047-38 ED1: Semiconductor devices – Micro-electromechanical devices – Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection

2020-09-11 2020-12-04 N Voting Result
47F/365/CC

Compilation of Comments on 47F/360/CD - IEC 62047-40 ED1: Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

2020-09-04 N
47F/359A/CC

Revised Compilation of Comments on 47F/356/CD - IEC 62047-41 ED1: Semiconductor devices - Micro-electromechanical devices – Part 41: RF MEMS Circulators and Isolators

2020-08-14 N
47F/358A/CC

Revised Compilation of Comments on 47F/354/CD - IEC 62047-38 ED1: Semiconductor devices – Micro-electromechanical devices – Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection

2020-07-24 N
47F/361/DC

Maintenance – call for comments/ proposals on publications coming up for review and a call for experts

2020-07-03 2020-09-25 N/A Report of Comments
47F/362/DA

Draft agenda for the meeting to be held in Frankfurt, Germany, on 2020-11-19 (starting time: 9:00 to approximate finishing time: 12:00)

2020-07-03 N/A
47F/348A/RVN

Revised Result of Voting on 47F/341/NP - PNW 47F-341: Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

2020-06-05 N
47F/360/CD

IEC 62047-40 ED1: Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

2020-06-05 2020-08-28 N Report of Comments