TC 113

[Revised Result of Voting on 113/518/NP - PNW TS 113-518: Nanomanufacturing - Material specification – Part X-X: Nanoporous activated carbon for electrochemical capacitor - Blank detail specification ]

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[Revised Result of Voting on 113/519/NP - PNW TS 113-519: Nanomanufacturing - Material specification – Part X-X: Nano-enabled electrode of electrochemical capacitor - Blank detail specification]

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[IEC TS 62607-6-6 ED1: Nanomanufacturing - Key control characteristics - Part 6-6: Graphene-based materials - Strain uniformity: spatially-resolved Raman spectroscoopy]

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[IEC TS 62607-6-21: Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material – Elemental composition and C/O ratio: XPS]

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[IEC TS 62607-6-20 ED1: Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based materials – Metallic impurity content: ICP-MS]

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[Unconfirmed minutes of the meeting held remotely on 2020-12-03 (starting time:13:00h CET to ending time: 18:20h CET)]

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[Review report of IEC TS 62607-2-1 ED1: Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance: Four terminal method]

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[Review report of IEC TS 62607-6-4 ED1: Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Sheet resistance: Microwave resonant cavity]

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[IEC TS 62607-6-16 ED1: Nanomanufacturing – Key control characteristics – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method]

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[Compilation of Comments on 113/553/CD - IEC TS 62607-6-6 ED1: Nanomanufacturing - Key control characteristics - Part 6-6: Graphene-based materials - Srain uniformity: spatially-resolved Raman spectroscoopy]

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[IEC TS 62607-6-11 ED1: Nanomanufacturing - Key control characteristics - Part 6-11: Graphene-based Material - Defect density: Raman spectroscopy]

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[Result of Voting on 113/503/DTS - ISO TS 80004-8 ED2: Nanotechnologies - Vocabulary - Part 8: Nanomanufacturing processes]

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[Result of Voting on 113/501/DTS - ISO TS 80004-3 ED2: Nanotechnologies - Vocabulary - Part 3: Carbon nano-objects]

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[IEC TS 62607-6-10: Nanomanufacturing - Key control characteristics - Part 6-10: Graphene-based material - Sheet resistance: Terahertz time-domain spectroscopy]

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[IEC TS 62607-6-9 ED1: Nanomanufacturing - Key control Characteristics - Part 6-9: Graphene-based material – Sheet resistance: Eddy current method]

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[PNW TS 113-570 ED1:

Nanomanufacturing – Key Control Characteristics – Part 6-12: Graphene-based material – Number of layers: Raman spectroscopy, optical reflection

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[PNW TS 113-571 ED1: IEC TS 62565-3-5: Nanomanufacturing - Material specifications - Part 3-5: Graphene-based material - Sectional blank detail specification: Graphene powder and dispersion]

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[Revised Result of Voting on 113/461/NP - PNW TS 113-461: IEC TS 62607-6-16: NANOMANUFACTURING – KEY CONTROL CHARACTERISTICS – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method]

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[Revised Result of Voting on 113/330/NP - IEC TS 62607-6-2: Nanomanufacturing - Key Control Characteristics - Part 6-2: Graphene - Evaluation of the number of layers of graphene]

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[Result of Voting on 113/548/DTR - IEC TR 63258 ED1: Nanotechnologies: A guideline for ellipsometry application to evaluate the thickness of nanoscale films]

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[Result of Voting on 113/539/DTS - IEC TS 62607-8-2: Nanomanufacturing - Key control Characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current.]

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[Next meeting of TC 113 to be held virtually from November 16th to December 3rd, 2020 (Announcement and Registration)]

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[Review of Active Participation of P-members in the Work of  TC 113]

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[First and final draft agenda for the 15^th TC 113 Plenary Meeting (virtual meeting) to be held via IEC Zoom Web-Conferencing on Thursday 2020-12-03: starting time: 13.00 CET expected finishing time: 16:00 CET]

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[Realization, time schedule and draft agendas for the TC 113 Working Group meetings to be held virtually via IEC Zoom Web-Conferencing from 2020-11-16 to 2020-11-26]

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[IEC TS 62607-6-19 ED1: Nanomanufacturing - Key control characteristics - Part 6-19: Graphene-based material - Elemental composition: CS analyzer, ONH analyzer]

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[Compilation of Comments on 113/540/CD - IEC TS 62607-9-1 ED1: Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic Force Microscopy]

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[Result of Voting on 113/497/NP - PNW TS 113-497: Nanomanufacturing - Key control characteristics - Part 6-12: Graphene film – Number of layers: Raman spectroscopy, optical reflection]

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[Compilation of Comments on 113/544/CD - IEC TS 62607-6-10: Nanomanufacturing - Key control characteristics - Part 6-10: Graphene film - Sheet resistance: Terahertz time-domain spectroscopy]

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[IEC TS 62607-6-6 ED1: Nanomanufacturing - Key control characteristics - Part 6-6: Graphene-based materials - Srain uniformity: spatially-resolved Raman spectroscoopy]

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[Result of Voting on 113/545/NP - PNW TS 113-545: Nanomanufacturing – key control characteristics – Part 6-7: Graphene material – Sheet resistance: van der Pauw method]

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[Result of Voting on 113/546/NP - PNW TS 113-546 ED1: Nanomanufacturing – key control characteriastics – Part 6-8: Graphene material – Sheet resistance: In-line four-point probe]

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[]

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[IEC TR 63258 ED1: Nanotechnologies: A guideline for ellipsometry application to evaluate the thickness of nanoscale films]

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[Result of Voting on 113/496/DTS - IEC TS 62607-6-3 ED1: Nanomanufacturing - Key control characteristics - Part 6-3: Graphene material – Domain size: Surface oxidation]

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[IEC TS 62607-6-5 ED1: Nanomanufacturing - Key control characteristics - Part 6-5: Graphene materials - Contact and sheet resistance: Transfer length method]

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[Revised Compilation of Comments on 113/487/CD - IEC TR 63258 ED1: Nanotechnology: A guideline for ellipsometry application to evaluate the thickness of nanoscale films]

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[Compilation of Comments on 113/504/CD - IEC TS 62607-6-9 ED1: Nanomanufacturing - Key control Characteristics - Part 6-9: Graphene material – Sheet resistance: Eddy current method]

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[IEC TS 62607-6-10: Nanomanufacturing - Key control characteristics - Part 6-10: Graphene film - Sheet resistance: Terahertz time-domain spectroscopy]

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[PNW TS 113-545: Nanomanufacturing – key control characteristics – Part 6-7: Graphene material – Sheet resistance: van der Pauw method]

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[PNW TS 113-546 ED1: Nanomanufacturing – key control characteriastics – Part 6-8: Graphene material – Sheet resistance: In-line four-point probe]

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[Revised Result of Voting on 113/521/NP - PNW TS 113-521: Nanomanufacturing – Key control characteristics – Part 2-5: Carbon nanotube materials – Density of vertically-aligned carbon nanotubes: X-ray absorption method]

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[IEC TS 62607-9-1 ED1: Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic Force Microscopy]

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[Result of Voting on 113/518/NP - PNW TS 113-518: Nanomanufacturing - Material specification – Part X-X: Nanoporous activated carbon for electrochemical capacitor - Blank detail specification ]

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[Result of Voting on 113/519/NP - PNW TS 113-519: Nanomanufacturing - Material specification – Part X-X: Nano-enabled electrode of electrochemical capacitor - Blank detail specification]

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[Revised Result of Voting on 113/401/NP - PNW TS 113-401: Nanotechnologies — Guidance on measurands for characterising nano-objects and materials that contain them]

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[Revised Result of Voting on 113/520/NP - PNW TS 113-520: Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation]

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[Compilation of Comments on 113/494/CD - IEC TS 62607-6-19 ED1: Nanomanufacturing - Key control characteristics - Part 6-19: Graphene powder - Elemental composition: CS analyzer, ONH analyzer]

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[Result of Voting on 113/495/DTS - IEC TS 62607-6-14 ED1: Nanomanufacturing – Key control characteristics – Part 6-14: Graphene powder – Defect level: Raman spectroscopy]

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[Compilation of Comments on 113/475/CD - IEC TS 62876-3-1 ED1: Nanomanufacturing - Reliability assessment - Part 3.1: Graphene materials - Stability test: Temperature and humidity]

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[IEC TS 62607-8-2: Nanomanufacturing - Key control Characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current.]

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[Revised Result of Voting on 113/520/NP - PNW TS 113-520: Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation]

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[Compilation of Comments on 113/506/CD - IEC TS 62607-8-2: Nanomanufacturing - Key control Characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current.]

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[Compilation of Comments on 113/500/CD - IEC TS 62607-6-5 ED1: Nanomanufacturing - Key control characteristics - Part 6-5: Graphene materials - Contact and sheet resistance: Transfer length method]

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[Result of Voting on 113/525/DTS - ISO TS 22292 ED1: Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy]

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[Compilation of Comments on 113/498/CD - IEC TS 62607-9-1 ED1: Nanomanufacturing – Key control characteristics – Part 9-1: Nanoscale stray magnetic field measurements: Magnetic force microscopy]

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[Result of Voting on 113/490/DTS - IEC TS 62607-3-3 ED1: Nanomanufacturing–Key control characteristics–Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime using Time Correlated Single Photon Counting (TCSPC)]

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[Result of Voting on 113/520/NP - PNW TS 113-520: Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation]

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[Result of Voting on 113/521/NP - PNW TS 113-521: Nanomanufacturing – Key control characteristics – Part 2-5: Carbon nanotube materials – Density of vertically-aligned carbon nanotubes: X-ray absorption method]

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[Compilation of Comments on 113/487/CD - IEC TR 63258 ED1: Nanotechnology: A guideline for ellipsometry application to evaluate the thickness of nanoscale films]

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[Result of Voting on 113/482/NP - PNW TS 113-482: Nanomanufacturing – key control characteriastics – Part 6-26: 2D materials – Fracture stain and stress, Young’s modulus, residual strain and stress: Bulge test]

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