TC 113

Nanotechnology for electrotechnical products and systems

 
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TC 113 Working Documents since 2019-12-06

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113/483A/RVN

Revised Result of Voting on 113/461/NP - PNW TS 113-461: IEC TS 62607-6-16: NANOMANUFACTURING – KEY CONTROL CHARACTERISTICS – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method

2020-11-27 N
113/350A/RVN

Revised Result of Voting on 113/330/NP - IEC TS 62607-6-2: Nanomanufacturing - Key Control Characteristics - Part 6-2: Graphene - Evaluation of the number of layers of graphene

2020-11-20 U
113/563/RVDTR

Result of Voting on 113/548/DTR - IEC TR 63258 ED1: Nanotechnologies: A guideline for ellipsometry application to evaluate the thickness of nanoscale films

2020-11-13 N
113/562/RVDTS

Result of Voting on 113/539/DTS - IEC TS 62607-8-2: Nanomanufacturing - Key control Characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current.

2020-11-06 N
113/558/AC

Next meeting of TC 113 to be held virtually from November 16th to December 3rd, 2020 (Announcement and Registration)

2020-10-23 N/A
113/559/INF

Review of Active Participation of P-members in the Work of  TC 113

2020-10-23 N/A
113/560/DA

First and final draft agenda for the 15th TC 113 Plenary Meeting (virtual meeting) to be held via IEC Zoom Web-Conferencing on Thursday 2020-12-03: starting time: 13.00 CET expected finishing time: 16:00 CET

2020-10-23 N/A
113/561/INF

Realization, time schedule and draft agendas for the TC 113 Working Group meetings to be held virtually via IEC Zoom Web-Conferencing from 2020-11-16 to 2020-11-26

2020-10-23 N/A
113/557/DTS

IEC TS 62607-6-19 ED1: Nanomanufacturing - Key control characteristics - Part 6-19: Graphene-based material - Elemental composition: CS analyzer, ONH analyzer

2020-10-16 2021-01-08 N
113/556/CC

Compilation of Comments on 113/540/CD - IEC TS 62607-9-1 ED1: Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic Force Microscopy

2020-10-09 N
113/555/RVN

Result of Voting on 113/497/NP - PNW TS 113-497: Nanomanufacturing - Key control characteristics - Part 6-12: Graphene film – Number of layers: Raman spectroscopy, optical reflection

2020-10-02 U
113/554/CC

Compilation of Comments on 113/544/CD - IEC TS 62607-6-10: Nanomanufacturing - Key control characteristics - Part 6-10: Graphene film - Sheet resistance: Terahertz time-domain spectroscopy

2020-09-18 N
113/553/CD

IEC TS 62607-6-6 ED1: Nanomanufacturing - Key control characteristics - Part 6-6: Graphene-based materials - Srain uniformity: spatially-resolved Raman spectroscoopy

2020-09-04 2020-10-30 N Report of Comments
113/551/RVN

Result of Voting on 113/545/NP - PNW TS 113-545: Nanomanufacturing – key control characteristics – Part 6-7: Graphene material – Sheet resistance: van der Pauw method

2020-08-14 N
113/552/RVN

Result of Voting on 113/546/NP - PNW TS 113-546 ED1: Nanomanufacturing – key control characteriastics – Part 6-8: Graphene material – Sheet resistance: In-line four-point probe

2020-08-14 N
113/550/DTS

2020-07-31 2020-10-23 U Voting Result
113/548/DTR

IEC TR 63258 ED1: Nanotechnologies: A guideline for ellipsometry application to evaluate the thickness of nanoscale films

2020-07-17 2020-09-11 N Voting Result
113/549/RVDTS

Result of Voting on 113/496/DTS - IEC TS 62607-6-3 ED1: Nanomanufacturing - Key control characteristics - Part 6-3: Graphene material – Domain size: Surface oxidation

2020-07-17 N
113/547/CD

IEC TS 62607-6-5 ED1: Nanomanufacturing - Key control characteristics - Part 6-5: Graphene materials - Contact and sheet resistance: Transfer length method

2020-06-05 2020-08-28 N Report of Comments
113/526A/CC

Revised Compilation of Comments on 113/487/CD - IEC TR 63258 ED1: Nanotechnology: A guideline for ellipsometry application to evaluate the thickness of nanoscale films

2020-05-29 N
113/543/CC

Compilation of Comments on 113/504/CD - IEC TS 62607-6-9 ED1: Nanomanufacturing - Key control Characteristics - Part 6-9: Graphene material – Sheet resistance: Eddy current method

2020-05-15 N
TC 119
113/544/CD

IEC TS 62607-6-10: Nanomanufacturing - Key control characteristics - Part 6-10: Graphene film - Sheet resistance: Terahertz time-domain spectroscopy

2020-05-15 2020-07-10 N Report of Comments
113/545/NP

PNW TS 113-545: Nanomanufacturing – key control characteristics – Part 6-7: Graphene material – Sheet resistance: van der Pauw method

2020-05-15 2020-08-07 N Voting Result
113/546/NP

PNW TS 113-546 ED1: Nanomanufacturing – key control characteriastics – Part 6-8: Graphene material – Sheet resistance: In-line four-point probe

2020-05-15 2020-08-07 N Voting Result
113/531A/RVN

Revised Result of Voting on 113/521/NP - PNW TS 113-521: Nanomanufacturing – Key control characteristics – Part 2-5: Carbon nanotube materials – Density of vertically-aligned carbon nanotubes: X-ray absorption method

2020-05-08 N
113/540/CD

IEC TS 62607-9-1 ED1: Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic Force Microscopy

2020-05-08 2020-07-31 N Report of Comments
113/541/RVN

Result of Voting on 113/518/NP - PNW TS 113-518: Nanomanufacturing - Material specification – Part X-X: Nanoporous activated carbon for electrochemical capacitor - Blank detail specification

2020-05-08 N
SC 21A
113/542/RVN

Result of Voting on 113/519/NP - PNW TS 113-519: Nanomanufacturing - Material specification – Part X-X: Nano-enabled electrode of electrochemical capacitor - Blank detail specification

2020-05-08 N
SC 21A
113/442A/RVN

Revised Result of Voting on 113/401/NP - PNW TS 113-401: Nanotechnologies — Guidance on measurands for characterising nano-objects and materials that contain them

2020-04-10 U
113/530B/RVN

Revised Result of Voting on 113/520/NP - PNW TS 113-520: Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation

2020-04-10 N
113/535/CC

Compilation of Comments on 113/494/CD - IEC TS 62607-6-19 ED1: Nanomanufacturing - Key control characteristics - Part 6-19: Graphene powder - Elemental composition: CS analyzer, ONH analyzer

2020-04-10 N
113/536/RVDTS

Result of Voting on 113/495/DTS - IEC TS 62607-6-14 ED1: Nanomanufacturing – Key control characteristics – Part 6-14: Graphene powder – Defect level: Raman spectroscopy

2020-04-10 N
113/537/CC

Compilation of Comments on 113/475/CD - IEC TS 62876-3-1 ED1: Nanomanufacturing - Reliability assessment - Part 3.1: Graphene materials - Stability test: Temperature and humidity

2020-04-10 N
113/539/DTS

IEC TS 62607-8-2: Nanomanufacturing - Key control Characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current.

2020-04-10 2020-07-03 N Voting Result
113/530A/RVN

Revised Result of Voting on 113/520/NP - PNW TS 113-520: Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation

2020-04-03 N
113/532/CC

Compilation of Comments on 113/506/CD - IEC TS 62607-8-2: Nanomanufacturing - Key control Characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current.

2020-04-03 N
113/533/CC

Compilation of Comments on 113/500/CD - IEC TS 62607-6-5 ED1: Nanomanufacturing - Key control characteristics - Part 6-5: Graphene materials - Contact and sheet resistance: Transfer length method

2020-04-03 N
113/534/RVDTS

Result of Voting on 113/525/DTS - ISO TS 22292 ED1: Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

2020-04-03 U
113/528/CC

Compilation of Comments on 113/498/CD - IEC TS 62607-9-1 ED1: Nanomanufacturing – Key control characteristics – Part 9-1: Nanoscale stray magnetic field measurements: Magnetic force microscopy

2020-03-27 N
113/529/RVDTS

Result of Voting on 113/490/DTS - IEC TS 62607-3-3 ED1: Nanomanufacturing–Key control characteristics–Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime using Time Correlated Single Photon Counting (TCSPC)

2020-03-27 N
113/530/RVN

Result of Voting on 113/520/NP - PNW TS 113-520: Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation

2020-03-27 N
113/531/RVN

Result of Voting on 113/521/NP - PNW TS 113-521: Nanomanufacturing – Key control characteristics – Part 2-5: Carbon nanotube materials – Density of vertically-aligned carbon nanotubes: X-ray absorption method

2020-03-27 N
113/526/CC

Compilation of Comments on 113/487/CD - IEC TR 63258 ED1: Nanotechnology: A guideline for ellipsometry application to evaluate the thickness of nanoscale films

2020-03-20 N
113/527/RVN

Result of Voting on 113/482/NP - PNW TS 113-482: Nanomanufacturing – key control characteriastics – Part 6-26: 2D materials – Fracture stain and stress, Young’s modulus, residual strain and stress: Bulge test

2020-03-20 N
113/524/RM

Unconfirmed minutes of the meeting held in Shanghai, China from 2019-10-25 (starting time: 09:00 - ending time: 17:00)

2019-12-20 N/A
113/525/DTS

ISO TS 22292 ED1: Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

2019-12-20 2020-03-13 U Voting Result
113/424A/RVN

Result of Voting on 113/400/NP - PNW TS 113-400: Nanotechnologies – 3D image reconstruction of nano-objects using transmission electron microscopy

2019-12-13 U
113/522/CC

Compilation of Comments on 113/478/CD - IEC TS 62607-5-2 ED1: Nanomanufacturing - Key control characteristics - Part 5-2: Thin-film organic/nano electronic devices - Measuring Alternating Current characteristics

2019-12-13 N
TC 119
113/523/RVDTS

Result of Voting on 113/477/DTS - IEC TS 62607-5-3: Nanomanufacturing – Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

2019-12-13 N
TC 119
113/520/NP

PNW TS 113-520: Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation

2019-12-06 2020-02-28 N Voting Result
113/521/NP

PNW TS 113-521: Nanomanufacturing – Key control characteristics – Part 2-5: Carbon nanotube materials – Density of vertically-aligned carbon nanotubes: X-ray absorption method

2019-12-06 2020-02-28 N Voting Result