International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 
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SC 47E Working Documents since 2018-10-18

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Date

Closing

Date

CENELEC

Voting /

Comment

Of interest to

Committees

47E/685/CC

Compilation of Comments on 47E/661/CD - IEC 60747-5-13 ED1: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

2019-10-11 N
SC 34A
47E/683/RR

Review report of IEC 60747-5-4 Ed.1: Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

2019-10-04 N
47E/684/RVD

Result of Voting on 47E/675/FDIS - IEC 60747-9 ED3: Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

2019-10-04 E
47E/674/CDV

IEC 60747-14-11 ED1: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

2019-09-27 2019-12-20 N
TC 49
47E/682/FDIS

IEC 60747-18-3 ED1: Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

2019-09-27 2019-11-08 N
47E/664A/DA

Revised draft agenda of the SC 47E meeting to be held in Shanghai, China on 17th October 2019 (14.00h – 17.00h)

2019-09-13 N/A
47E/673/CDV

IEC 60747-16-5/AMD1 ED1: Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

2019-09-13 2019-12-06 Y
TC 49
47E/680/INF

Maintenance – call for comments or proposals on the publications which need to be reviewed and a call for experts

2019-09-06 N/A
47E/681/INF

Review of Active Participation of P-members in the Work of SC 47E

2019-09-06 N/A
47E/679/FDIS

IEC 60747-14-10 ED1: Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

2019-08-23 2019-10-04 N Voting Result
SC 47F
TC 62
TC 124
47E/675/FDIS

IEC 60747-9 ED3: Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

2019-08-16 2019-09-27 E Voting Result
47E/676/RVC

Result of Voting on 47E/651/CDV - IEC 60747-5-9 ED1: Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

2019-08-16 N
47E/677/RVC

Result of Voting on 47E/652/CDV - IEC 60747-5-10 ED1: Semiconductor devices – Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the room-temperature reference point

2019-08-16 N
47E/678/RVC

Result of Voting on 47E/653/CDV - IEC 60747-5-11 ED1: Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

2019-08-16 N
47E/670/NP

PNW 47E-670: Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

2019-07-26 2019-10-18 U
47E/671/NP

PNW 47E-671: Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

2019-07-26 2019-10-18 U
47E/672/RVC

Result of Voting on 47E/635/CDV - IEC 60747-7/AMD1 ED3: Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

2019-07-26 N
47E/669/CD

IEC 60747-8/AMD1 ED3: Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

2019-07-19 2019-09-13 N Report of Comments
47E/667/CC

Compilation of Comments on 47E/639/CD - IEC 60747-14-11 ED1: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

2019-07-12 N
TC 49
47E/668/RVC

Result of Voting on 47E/642/CDV - IEC 60747-19-1 ED1: Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors

2019-07-12 E
47E/662/CC

Compilation of Comments on 47E/649/CD - IEC 60747-16-5/AMD1 ED1: Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

2019-06-28 Y
TC 49
47E/663/CC

Compilation of Comments on 47E/645/CD - IEC 60747-5-6 ED2: Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

2019-06-28 N
SC 34A
47E/664/DA

Draft agenda of the SC 47E meeting to be held in Shanghai, China on 17th October 2019 (14.00h – 17.00h)

2019-06-28 N/A
47E/665/RVN

Result of Voting on 47E/647/NP - PNW TS 47E-647: Future IEC 60747-19-2: Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of smart sensors and power supplies to drive smart sensors

2019-06-28 N
47E/666/CD

IEC TS 60747-19-2 ED1: Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of smart sensors and power supplies to drive smart sensors

2019-06-28 2019-09-20 N Report of Comments
47E/659/RVC

Result of Voting on 47E/631/CDV - IEC 60747-18-2 ED1: Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package module

2019-06-14 N
47E/660/RVC

Result of Voting on 47E/632/CDV - IEC 60747-18-3 ED1: Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package module with fluidic system

2019-06-14 N
47E/661/CD

IEC 60747-5-13 ED1: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

2019-06-14 2019-08-09 N Report of Comments
SC 34A
47E/655/CDV

IEC 60747-5-5 ED2: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

2019-05-31 2019-08-23 Y Voting Result
47E/651/CDV

IEC 60747-5-9 ED1: Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

2019-05-17 2019-08-09 N Voting Result
47E/652/CDV

IEC 60747-5-10 ED1: Semiconductor devices – Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the room-temperature reference point

2019-05-17 2019-08-09 N Voting Result
47E/653/CDV

IEC 60747-5-11 ED1: Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

2019-05-17 2019-08-09 N Voting Result
47E/654/CDV

IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

2019-05-17 2019-08-09 Y Voting Result
47E/658/RVC

Result of Voting on 47E/637/CDV - IEC 60747-5-8 ED1: Semiconductor devices – Part 5-8: Optoelectronic devices – Light emitting diodes – Test method of optoelectronic efficiencies of light emitting diodes

2019-05-17 E
47E/657/RVD

Result of Voting on 47E/643A/FDIS - IEC 60747-18-1 ED1: Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

2019-04-26 N
47E/623A/RVC

Result of Voting on 47E/595/CDV - IEC 60747-5-5 ED2: Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

2019-04-12 Y
47E/650/CC

Compilation of Comments on 47E/636/CD - IEC 60747-5-11 ED1: Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

2019-03-29 N
47E/642/CDV

IEC 60747-19-1 ED1: Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors

2019-03-22 2019-06-14 E Voting Result
47E/648/RR

Review report of IEC 60747-16-5 Ed.1: Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

2019-03-22 Y
TC 49
47E/649/CD

IEC 60747-16-5/AMD1 ED1: Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

2019-03-22 2019-05-17 Y Report of Comments
TC 49
47E/640A/RVN

Result of Voting on 47E/614/NP - PNW 47E-614: Future 60747-19-2: Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of low-power smart sensors allowing autonomous power supply operation

2019-03-08 N
47E/646/CC

Compilation of Comments on 47E/620/CD - IEC 60747-17 ED1: Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

2019-03-08 N/A
47E/647/NP

PNW TS 47E-647: Future IEC 60747-19-2: Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of smart sensors and power supplies to drive smart sensors

2019-03-08 2019-05-31 N Voting Result
47E/643A/FDIS

IEC 60747-18-1 ED1: Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

2019-02-22 2019-04-05 N Voting Result
47E/643/FDIS

Replaced by 47E/643A/FDIS

2019-02-15 2019-03-29 N
47E/644/RR

Review report of IEC 60747-5-6 Ed.1: Semiconductor devices – Part 5-6: Optoelectronic devices – Light emitting diodes

2019-02-15 N
SC 34A
47E/645/CD

IEC 60747-5-6 ED2: Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

2019-02-15 2019-05-10 N Report of Comments
SC 34A
47E/641A/CC

Compilation of Comments on 47E/615/CD - IEC 60747-19-1 ED1: Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors

2019-02-01 E
47E/635/CDV

IEC 60747-7/AMD1 ED3: Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

2019-01-25 2019-04-19 N Voting Result
47E/637/CDV

IEC 60747-5-8 ED1: Semiconductor devices – Part 5-8: Optoelectronic devices – Light emitting diodes – Test method of optoelectronic efficiencies of light emitting diodes

2019-01-25 2019-04-19 E Voting Result
47E/631/CDV

IEC 60747-18-2 ED1: Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package module

2019-01-11 2019-04-05 N Voting Result
47E/632/CDV

IEC 60747-18-3 ED1: Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package module with fluidic system

2019-01-11 2019-04-05 N Voting Result
47E/639/CD

IEC 60747-14-11 ED1: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

2019-01-11 2019-03-08 N Report of Comments
TC 49
47E/640/RVN

Result of Voting on 47E/614/NP - PNW 47E-614: Future 60747-19-2: Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of low-power smart sensors allowing autonomous power supply operation

2019-01-11 N
47E/641/CC

Compilation of Comments on 47E/615/CD - IEC 60747-19-1 ED1: Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors

2019-01-11 E
47E/626A/CC

Compilation of Comments on 47E/604/CD - IEC 60747-14-11 ED1: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

2019-01-04 N
TC 49
47E/638/RR

Review report of IEC 60747-8 Ed.3: Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

2019-01-04 N
47E/628A/RVN

Result of Voting on 47E/601/NP - PNW 47E-601: Future IEC 60747-5-13: Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

2018-12-07 N
SC 34A
47E/633A/RVN

Result of Voting on 47E/619/NP - PNW 47E-619: Future IEC 60747-5-11: Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

2018-12-07 N
47E/634/RM

Unconfirmed minutes of the IEC/SC 47E meeting held in Busan, Korea on Oct. 18th, 2018

2018-12-07 N/A
47E/636/CD

IEC 60747-5-11 ED1: Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

2018-12-07 2019-02-01 N Report of Comments
47E/624A/CC

Compilation of Comments on 47E/610/CD - IEC 60747-5-62 ED1: Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

2018-11-30 N
47E/625A/CC

Compilation of Comments on 47E/611/CD - IEC 60747-5-63 ED1: Semiconductor devices – Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency by the room-temperature reference point

2018-11-30 N
47E/633/RVN

Result of Voting on 47E/619/NP - PNW 47E-619: Future IEC 60747-5-11: Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

2018-11-30 N
47E/630/RVC

Result of Voting on 47E/605/CDV - IEC 60747-9 ED3: Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

2018-11-02 E
47E/629/DL

List of decisions taken at the meeting of SC47E, held in Busan, Korea on 18th Oct., 2018

2018-10-26 N/A