International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47A

Integrated circuits

 
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SC 47A Working Documents since 2019-10-26

Reference, Title
Downloads

Circulation

Date

Closing

Date

CENELEC

Voting /

Comment

Of interest to

Committees

47A/1104A/DA

Revised draft agenda for the SC 47A meeting to be held online, on 2020-11-19 (from 12:00 to 15:00 CEST)

2020-10-16 N/A
47A/1105/INF

Review of Active Participation of P-members in the Work of  47A

2020-10-16 N/A
47A/1104/DA

Draft agenda for the SC 47A meeting to be held online, on 2020-11-19 (from 12:00 to 15:00 CEST)

2020-09-25 N/A
47A/1103/CD

IEC 62228-7 ED1: Integrated circuits - EMC evaluation of transceivers – Part 7: CXPI transceivers

2020-08-28 2020-10-23 Y Report of Comments
47A/1101/CDV

IEC 61967-4 ED2: Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

2020-07-31 2020-10-23 Y Voting Result
47A/1102/CDV

IEC 62228-5 ED1: Integrated circuits – EMC evaluation of transceivers – Part 5: Ethernet transceivers

2020-07-31 2020-10-23 Y Voting Result
47A/1096A/CC

Revised Compilation of Comments on 47A/1091/CD - IEC 62228-7 ED1: Integrated circuits - EMC evaluation of transceivers – Part 7: CXPI transceivers

2020-06-05 Y
47A/1097A/CC

Revised Compilation of Comments on 47A/1093/CD - IEC 62228-5 ED1: Integrated circuits – EMC evaluation of transceivers – Part 5: Ethernet transceivers

2020-06-05 Y
47A/1099A/RVN

Revised Result of Voting on 47A/1092/NP - PNW 47A-1092: Future IEC 62228-6: Integrated circuit – EMC Evaluation of transceivers – Part 6: PSI5 transceivers

2020-06-05 Y
47A/1100/CC

Compilation of Comments on 47A/1095/CD - IEC 61967-4 ED2: Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

2020-06-05 Y
47A/1098/RVC

Result of Voting on 47A/1090/CDV - IEC 62433-6 ED1: EMC IC modelling – Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity modelling (ICIM-CPI)

2020-05-29 Y
47A/1076B/CC

Revised Compilation of Comments on 47A/1072/CD - IEC 61967-4 ED2: Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

2020-03-27 Y
47A/1095/CD

IEC 61967-4 ED2: Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

2020-03-27 2020-05-22 Y Report of Comments
47A/1094/Q

Withdrawal of IEC 62132-3:2007 ED1: Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method

2020-03-06 2020-05-08 N/A Report of Comments
47A/1093/CD

IEC 62228-5 ED1: Integrated circuits – EMC evaluation of transceivers – Part 5: Ethernet transceivers

2020-02-14 2020-04-10 Y Report of Comments
47A/1075B/CC

Revised Compilation of Comments on 47A/1071/CD - IEC 62228-5 ED1: Integrated circuits – EMC evaluation of transceivers – Part 5: Ethernet transceivers

2020-02-07 Y
47A/1092/NP

PNW 47A-1092: Future IEC 62228-6: Integrated circuit – EMC Evaluation of transceivers – Part 6: PSI5 transceivers

2020-02-07 2020-05-01 Y Voting Result
47A/1090/CDV

IEC 62433-6 ED1: EMC IC modelling – Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity modelling (ICIM-CPI)

2020-01-24 2020-04-17 Y Voting Result
47A/1091/CD

IEC 62228-7 ED1: Integrated circuits - EMC evaluation of transceivers – Part 7: CXPI transceivers

2020-01-03 2020-03-27 Y Report of Comments
47A/1086A/CC

Compilation of Comments on 47A/1080/CD - IEC 62228-7 ED1: Integrated circuits - EMC evaluation of transceivers – Part 7: CXPI transceivers

2019-12-20 Y
47A/1078A/CC

Compilation of Comments on 47A/1074/CD - IEC 62433-6 ED1: EMC IC modelling – Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity modelling (ICIM-CPI)

2019-12-06 Y
47A/1088/RVN

Result of Voting on 47A/1081/NP - PNW 47A-1081: Integrated circuits - Three dimensional integrated circuits - Part 5: Known-good-die test of partly integrated circuits

2019-11-22 N
47A/1089/RVN

Result of Voting on 47A/1082/NP - PNW 47A-1082: INTEGRATED CIRCUITS - Three dimensional integrated circuits - Part 6: Thermomechanical reliability test method

2019-11-22 N
47A/1087A/RM

Report of the meeting held in Shanghai EXPO Center Room 407, Shanghai, China on 2019-10-17 (starting time: 14:00 ending time: 16:00)

2019-11-15 N/A
47A/1087/RM

Replaced by 47A/1087A/RM

2019-11-01 N/A